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The purpose of this paper is to study the influence of silver on the high‐temperature oxidation behaviour of the Sn‐8.5Zn‐xAg‐0.01Al‐0.1Ga (x=0, 0.1, 0.3 and 0.5) solder alloys.

The weight gains of the studied solders are measured using thermal gravimetric analyzers (TGA) at temperatures of 250, 300, 350 and 400°C. The weight gains measured are used to compare the oxidation behaviour of the studied solders. The surfaces of the solders are also analyzed with Auger emission spectroscopy (AES) depth profiling and thin‐film X‐ray diffractometry (thin‐film XRD) to identify the elements present on the surface of the studied solders.

The TGA results show that the weight gains decrease with increasing silver content in the studied solders. It meant that increasing silver content could help improve the high‐temperature oxidation behaviour of the studied solder. AES and thin‐film XRD confirm that the formed oxide layers on the surface of the studied solder are Zn‐based oxide layers.

The findings of this paper will help provide an understanding of the effects of silver on Sn‐8.5Zn‐xAg‐0.01Al‐0.1Ga solder.

The purpose of this paper is to investigate the morphology evolution and the composition transformation of Au-Sn intermetallic compounds (IMCs) of the new Au/Sn-5Sb-1Cu-0.1Ni-0.1Ag/(Au)Ni solder joint during the high temperature aging.

Sn-5Sb-1Cu-0.1Ni-0.1Ag solder balls (500 µm in diameter), heat sink with structure of 7.4 µm Au layer on 5 µm Ni-plated Cu alloy and Si chip with 5.16 µm plated Au were used to fabricate micro-solder joints. The joints were performed in a furnace at 150°C for 150, 250 and 350 h aging. The samples were polished and deep etched before analyzed by metallographic microscope and scanning electron microscopy, respectively. Energy dispersive x-ray spectroscopy was used to identify the composition of the IMCs.

ß-(Au,Ni,Cu)₁₀Sn phase is formed during the soldering process. The IMCs evolution has two periods during the aging. The first is the ξ-(Au,Ni,Cu)₅Sn, ξ-(Au,Cu)₅Sn and δ-AuSn were formed and grew to form a full-compound joint after about 150 h aging. The second is the conversion of the full-compound joint. The IMCs converted to ξ′ phase when the aging time extends to 250 h, and transformed to ε-(Au,Ni,Cu)Sn₂ and η-(Au,Ni,Cu)Sn₄ after 350 h aging. The thicker gold layer and thinner solder joint can promote the growth of the IMCs. ß-(Au,Ni,Cu)₁₀Sn emerged in Au/SnSb-CuNiAg/(Au)Ni in this research, which is not usually found.

The results in this study have a significant meaning for the application of the new Sn-5Sb-1Cu-0.1Ni-0.1Ag in harsh conditions.

The purpose of this paper is to design a novel die-attach composite joint for high-temperature die-attach applications based on transient liquid phase bonding. Moreover, the microstructure, shear strength, electrical property, thermal conductivity and aging property of the composite joint were investigated.

The composite joint was made of microporous copper and Cu₃Sn. Microporous copper was immersed into liquid Sn to achieve Sn-microporous copper composite structure for die attachment. By the thermo-compression bonding, the Cu₃Sn-microporous copper composite joint with a thickness of 100 µm was successfully obtained after bonding at 350 °C for 5 min under a low pressure of 0.6 MPa.

After thermo-compression bonding, the resulting interconnection could withstand a high temperature of at most 676 °C, with the entire Sn transforming into Cu₃Sn with high remelting temperatures. A large shear strength could be achieved with the Cu₃Sn-microporous copper in the interconnections. The formed bondlines demonstrated a good electrical and thermal conductivity owing to the large existing amount of copper in the interconnections. Furthermore, the interconnection also exhibited excellent reliability under high temperature aging at 300 °C.

This die-attach composite joint was suitable for power devices operating under high temperatures or other harsh environments.

This study aims to investigate soldering of SiC ceramics by using Zn-Al-In-based solders and ultrasonic soldering. The focus was on the quality of soldered joints, examining the boundary of the solder/substrate joint and the strength of the fabricated joints. Moreover, the fractured surfaces of joints were assessed.

The Zn-5Al base, which is considered for eutectic solder, was used in experiments. When manufacturing this solder, In was also added to at 1 Wt.%. The soldering of SiC substrates on a hot plate with ultrasonic assistance was performed.

The solder at room temperature consists of a primary segregated solid solution (Zn) and the binary eutectics (Zn) + (Al) with a high Al content and binary lamellar eutectic with a high Zn and In content non-uniformly distributed on the grain boundaries. The average tensile strength of the Zn5Al1In solder was 52 MPa. The ceramic material was wetted during soldering via reaction between the solder and the SiC substrate, with the formation of Al-Si reaction products. The thickness of the reaction layer on the boundary was 0.5–1.1 µm. The average strength of the soldered joint was 59 MPa. The obtained results confirmed the high efficiency of ultrasonic soldering in air.

This work has characterised Zn5Al1In soldering alloy and examining soldering SiC ceramics by a flux-less ultrasonic process. The analyses were oriented to assess the strength and structure of the solder and the soldered joints. Based on the achieved results, it is possible to predict the suitability of the solder alloy for flux-free soldering of SiC ceramics.

Sn‐Zn based lead free solders with a melting temperature around 199°C are an attractive alternative to the conventional Sn‐Pb solder and the addition of bismuth improves its wetability. Whilst lead‐free soldering with Sn‐8Zn‐3Bi has already been used in the electronics assembly industry, it is necessary to study its low cycle fatigue properties since such data have not been reported up to now.

In this study, displacement‐controlled low cycle fatigue testing of Sn‐8Zn‐3Bi and Sn‐37Pb solder joints was done on lap shear samples. The test amplitude was varied whilst the frequency was kept constant at 0.2 Hz and failure was defined as a 50 per cent load reduction. Finite element (FE) modelling was used for analysis and the results were compared to the experimental data.

The microstructure of the Sn‐8Zn‐3Bi solder showed a mixed phase of small cellular‐shaped and coarser needle‐shaped areas. Au‐Zn intermetallic compounds were observed near the interface from the SEM‐EDS observation. The average lifetime for the Sn‐8Zn‐3Bi solder joints was 17 per cent longer compared to the Sn‐37Pb solder joints. The cross section observation indicated that the fatigue cracks propagated along the interface between the solder bulk and the Au/Ni layer. The locations of maximum equivalent stress from the FE simulation were found to be at the two opposite corners of the solder joints, coinciding with the experimental observations of crack initiation.

This is believed to be the first time, the low cycle fatigue properties of Sn‐8Zn‐3Bi solder have been reported.

The purpose of this paper is to review and examine three of the most common corrosion characterization techniques specifically on Sn-Zn solders. The discussion will highlight the configurations and recent developments on each of the compiled characterization techniques of potentiodynamic polarization, potentiostatic polarization and electrochemical impedance spectroscopy (EIS).

The approach will incorporate a literature review of previous works related to the experimental setups and common parameters.

The potentiostatic polarization, potentiodynamic polarization and EIS were found to provide crucial and vital information on the corrosion properties of Sn-Zn solders. Accordingly, this solder relies heavily on the amount of Zn available because of the inability to produce the intermetallic compound in between the elements. Further, the excellent mechanical properties and low melting temperature of the Sn-Zn solder is undeniable, however, the limitations regarding corrosion resistance present opportunities in furthering research in this field to identify improvements. This is to ensure that the corrosion performance can be aligned with the outstanding mechanical properties. The review also identified and summarized the advantages, recent trends and important findings in this field.

The unique challenges and future research directions regarding corrosion measurement in Sn-Zn solders were shown to highlight the rarely discussed risks and problems in the reliability of lead-free soldering. Many prior reviews have been undertaken of the Sn-Zn system, but limited studies have investigated the corrosive properties. Therefore, this review focuses on the corrosive characterizations of the Sn-Zn alloy system.

The purpose of this paper is to improve the properties of Sn−9Zn solder, so as to meet the requirements of industrial applications.

The effects of Praseodymium on property and Sn whisker growth under aging treatment in Sn−9Zn lead‐free solder were investigated.

The results indicate that with the addition of rare earth Pr, the wettability and mechanical properties of Sn−9Zn solder were improved. The best wettability and comprehensive property of soldered joint is obtained when the content of Pr is 0.08 wt.%. After aging treatment at 150°C for 360 h, the mechanical properties of Sn−9Zn−0.08Pr decreased but are still obviously higher than that of Sn−9Zn. Moreover, when the content of Pr reached 0.1 wt.%, plenty of Sn−Pr compounds were found in the Sn−9Zn solder. The inevitable oxidation of Sn−Pr compounds would cause a high stress accumulated within PrSn3 phases, which would be served as driving force to induce the Sn whisker sprout and growth after aging treatment at 150°C for 120 h to 360 h. Compared with the results in Sn−9Zn−0.5Ga−0.7Pr solder that Sn whisker observed until the addition of Pr reached 0.7 wt.%, it could be inferred that the addition of Ga may react against the sprout of Sn whisker.

It is found that the addition of Pr can improve the properties of solder and avoid Sn whisker growth in the right range and proper conditions. The cost of the solder with added Pr is limited to RMB 2 yuan/kg so it can be widely used in industry.

The purpose of this paper is to investigate the growth behavior and mechanism of Sn whisker induced by RE addition in Sn‐Zn‐Ga‐Pr solder at ambient condition.

By means of aging treatment, FIB and SEM microstructure analysis, the whisker growth behavior was investigated.

It was found that the morphologies of tin whisker are changed during air exposure. After 60 days aging, the average length of the longest whiskers could reach up to 70 μm, some whiskers even can grow to a length of 100 μm. It was discussed that the oxidation of Pr‐Sn intermetallics provides driving force for whisker growth.

Tin whisker growth is a complex reliability issue for lead‐free solder. The current research can be helpful in re‐understanding the issue of tin whisker growth as well as an enriched understanding on the effects of REs on lead‐free solders.

The interfacial structure is vitally important for achieving a good joint reliability during service. The purpose of this paper is to systematically explore the effects of Zn addition into the Sn-3.5Ag eutectic solder on the formation of intermetallic compound (IMC) layer at the interface between Sn-3.5Ag-xZn (x = 0, 0.9 and 3) solders and Cu pad.

To obtain useful information on the formation of interfacial structure and to determine an effective way to avoid the formation of brittle joints, a series of Sn-Ag lead-free solders with different Zn contents were prepared and soldered. To investigate the IMC layers between Sn-3.5Ag-xZn (x = 0, 0.9 and 3) lead-free solders and the Cu pads, three specimens of the Sn-3.5Ag-xZn/Cu were soldered at 250°C for one min.

It is found that the addition of Zn in the Sn-3.5Ag eutectic solder can prompt the formation of Cu₅Zn₈ IMCs, and restrain the formation of the Cu₆Sn₅ IMCs. Moreover, the addition of Zn in the Sn-3.5Ag eutectic solder will reduce the solubility of Cu in the liquid solder, which accelerates the growth of the formed IMCs. Consequently, the thickness of IMC layer increases with increasing the content of Zn.

This paper usefully demonstrates how the addition of Zn favoured the formation of the Cu₅Zn₈ phase and restrained the formation of the Cu₆Sn₅ phase. Moreover, the addition of Zn in the Sn-Ag eutectic solder would reduce the solubility of Cu in the liquid solder, which accelerates the growth of the formed IMCs. Consequently, the thickness of the IMC layer increased with increasing concentration of Zn.

This paper aims to study the diffusion of Zn, Ni and Sn in the liquid state during the reflow ageing of the Sn-Zn solder above its melting point on an Ni/Cu substrate in relation to the formation of intermetallic compounds (IMCs).

The Sn-Zn solder is reflowed on Ni/Cu substrates and is aged at 503 K. The formation of IMCs and their composition is characterized using scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX). Diffusion coefficients and diffusion distances of Zn, Ni and Sn in the liquid state during reflow and ageing are theoretically calculated. Both experimental and theoretical behaviours for Ni and Zn diffusions are compared.

Calculations show a linear increment in the liquid-state diffusion coefficients of Ni, Zn and Sn in the solder matrix with a rise in temperature, but they remained constant during ageing. However, diffusion distances increased slowly with temperature but manifold with ageing time. The experimental results revealed segregation of Zn and Ni at the interface in the as-reflow aged specimens. The Zn was concentrated at the solder–substrate interface and it reacted with Ni diffusing from the substrate to form Ni-Sn-Zn IMCs. The rapid diffusion of Zn and Ni with the increase in ageing time increased their atomic concentrations in the IMCs against the reduction in Sn concentration owing to a comparatively slower diffusion.

The novelty of the paper is the detailed study of theoretical diffusion of Zn, Sn and Ni in the liquid state during reflow ageing of Sn-Zn above its melting points on a Ni/Cu substrate. This is compared with values obtained experimentally and related to the mechanisms of IMC formation.