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Article
Publication date: 1 April 1998

Achim Raab, Christian Jung and Peter Dullenkopf

An investigation of laser‐trimmed thick‐film resistors’ current noise was carried out. A large number of samples from two pastes with different P‐ and L‐cuts were prepared. The…

276

Abstract

An investigation of laser‐trimmed thick‐film resistors’ current noise was carried out. A large number of samples from two pastes with different P‐ and L‐cuts were prepared. The noise spectrum of the trimmed resistors was measured to obtain a relationship between the current noise and the cut parameters. A simple but comprehensive electrical model for the simulation of the current noise of trimmed resistors is also presented. The results from the noise simulation agree with the measured data.

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Microelectronics International, vol. 15 no. 1
Type: Research Article
ISSN: 1356-5362

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Publication date: 1 December 2000

Achim Köhler and Peter Dullenkopf

The realization of thick‐film circuits on glass substrates is discussed. Within the large number of commercially available thick‐film pastes, suitable pastes for thick‐film…

278

Abstract

The realization of thick‐film circuits on glass substrates is discussed. Within the large number of commercially available thick‐film pastes, suitable pastes for thick‐film conductors, resistors and dielectrics on glass substrates have been found. Experimental results for these pastes are presented. Finally two applications for thick‐film on glass technology are demonstrated.

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Microelectronics International, vol. 17 no. 3
Type: Research Article
ISSN: 1356-5362

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Article
Publication date: 1 March 1989

Hamish Law

Dates: 29–31 May 1991 Venue: De Doelen Conference Centre, Rotterdam, The Netherlands The Benelux Chapter of the International Society for Hybrid Microelectronics will be…

25

Abstract

Dates: 29–31 May 1991 Venue: De Doelen Conference Centre, Rotterdam, The Netherlands The Benelux Chapter of the International Society for Hybrid Microelectronics will be organising the 8th European Microelectronics Conference. The event will take place at ‘De Doelen’, Rotterdam, The Netherlands, from 29 to 31 May 1991.

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Microelectronics International, vol. 6 no. 3
Type: Research Article
ISSN: 1356-5362

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