Current noise of trimmed thick‐film resistors: measurement and simulation

Abstract

An investigation of laser‐trimmed thick‐film resistors’ current noise was carried out. A large number of samples from two pastes with different P‐ and L‐cuts were prepared. The noise spectrum of the trimmed resistors was measured to obtain a relationship between the current noise and the cut parameters. A simple but comprehensive electrical model for the simulation of the current noise of trimmed resistors is also presented. The results from the noise simulation agree with the measured data.

Citation

Raab, A., Jung, C. and Dullenkopf, P. (1998), "Current noise of trimmed thick‐film resistors: measurement and simulation", Microelectronics International, Vol. 15 No. 1, pp. 15-22. https://doi.org/10.1108/13565369810199077