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This paper aims to investigate the effect of physical vapor deposition (PVD)-coated stencil wall aperture on the life span of fine-pitch stencil printing.

The fine-pitch stencil used in this work is fabricated by electroform process and subsequently nano-coated using the PVD process. Stencil printing process was then performed to print the solder paste onto the printed circuit board (PCB) pad. The solder paste release was observed by solder paste inspection (SPI) and analyzed qualitatively and quantitatively. The printing cycle of up to 80,000 cycles was used to investigate the life span of stencil printing.

The finding shows that the performance of stencil printing in terms of solder printing quality is highly dependent on the surface roughness of the stencil aperture. PVD-coated stencil aperture can prolong the life span of stencil printing with an acceptable performance rate of about 60%.

Stencil printing is one of the important processes in surface mount technology to apply solder paste on the PCB. The stencil’s life span greatly depends on the type of solder paste, stencil printing cycles involved and stencil conditions such as the shape of the aperture, size and thickness of the stencil. This study will provide valuable insight into the relationship between the coated stencil wall aperture via PVD process on the life span of fine-pitch stencil printing.

This paper aims to analyze the effect of surface roughness and hardness of leadframe on the bondability of gold (Au) wedge bond using in situ inspection of laser interferometer and its relationship with the deformation and wire pull strength.

The in situ inspection of ultrasonic vibration waveform through the changes of vertical axis (y-axis) amplitude of wire bonder capillary was carried out using laser interferometer to analyze the formation of Au wedge bond. The relationship between the changes of ultrasonic waveform of capillary with the deformation and the pull strength was analyzed to evaluate the bondability of Au wedge bonds.

It was observed that the changes in vertical axis amplitude of ultrasonic vibration waveform of wire bonder capillary can be used to describe the process of bonding formation. The loss of ultrasonic energy was exhibited in ultrasonic vibration waveform of wire bonding on leadframe that has higher value of roughness (leadframe A) as compared to that of leadframe that has lower value of roughness (leadframe B). The lower pull strength obtained by Au wedge bond further confirms the reduction of bond formation because of the higher deformation on leadframe A as compared to that of leadframe B.

The relationship between in situ measurement using laser interferometer with the bondability or deformation and wire pull strength of Au wedge bonds on different surface roughness and hardness of leadframes is still lacking. These findings provide a valuable data in analyzing the bonding mechanisms that can be identified based on the in situ measurement of ultrasonic vibration and the bondability of Au wedge bonds.

The purpose of this paper is to discuss the effect of a blast wave on the microstructure, intermetallic layers and hardness properties of Sn0.3Ag0.7Cu (SAC0307) lead-free solder.

Soldered samples were exposed to the blast wave by using trinitrotoluene (TNT) explosive. Microstructure and intermetallic layer thickness were identified using Alicona ® Infinite Focus Measurement software. Hardness properties of investigated solders were determined using a nanoindentation approach.

Microstructure and intermetallic layers changed under blast wave condition. Hardness properties of exposed solders decreased with an increase in the TNT explosive weight.

Microstructural evolution and mechanical properties of the exposed solder to the blast wave provide a fundamental understanding on how blast waves can affect the reliability of a solder joint, especially for military applications.

This paper aims to investigate the effect of different doses of gamma radiation on the micromechanical response (hardness properties and creep behaviour) of 96.5Sn-3.0Ag-0.5Cu (SAC305) solder alloys.

SAC305 solder pastes deposited on printed circuit boards (PCBs) were subjected to a reflow soldering process to form soldered samples. The soldered samples were irradiated with a gamma source at different doses (5–50 Gy). Nanoindentation testing was used to determine the hardness properties and creep behaviour after gamma irradiation.

The results showed that the hardness of SAC305 solder alloys gradually increased up to 15 Gy and then gradually decreased to 50 Gy of gamma irradiation. The highest hardness value (0.37 GPa) was observed on SAC305 solder alloys exposed to 15 Gy irradiation. Hardening of SAC305 solder alloy was suggested to be due to the high defect density induced by the gamma irradiation. Meanwhile, exposure to 50 Gy irradiation resulted in the lowest hardness value, 0.13 GPa. The softening behaviour of SAC305 solder alloy was probably due to the evolution of defect size in the solder joint. In addition, the creep behaviour of the SAC305 solder alloys changed significantly with different gamma irradiation doses. The creep rates were higher at a dose of 10 Gy up to a dose of 50 Gy. Gamma irradiation caused the SAC305 solder alloy to become more ductile compared to the non-irradiated alloy. The stress exponent also showed different deformation mechanisms with varying gamma doses.

Research into the micromechanical properties of solder alloys subjected to gamma irradiation has rarely been reported, especially for Sn-Ag-Cu lead-free solder. Thus, this research provides a fundamental understanding of the micromechanical response (hardness and creep behaviour) of solder, especially lead-free solder alloy, to gamma irradiation.

The purpose of this paper is to investigate the wettability and intermetallic (IMC) layer formation of Sn-3.0Ag-0.5Cu (SAC305)/CNT/Cu solder joint according to the formulation of solder paste because of different types of fluxes.

Solder pastes were prepared by mixing SAC305 solder powder with different flux and different wt.% of carbon nanotube (CNT). Fourier transform infrared spectroscopy was used to identify functional groups from different fluxes of as-formulated solder paste. The solder pastes were then subjected to stencil printing and reflow process. Solderability was investigated via contact angle analysis and the thickness of cross-sectionally intermetallic layer.

It was found that different functional groups from different fluxes showed different physical behaviour, indicated by contact angle value and IMC layer thickness. “Aromatic contain” functional group lowering the contact angle while non-aromatic contain functional group lowering the thickness of IMC layer. The higher the CNT wt.%, the lower the contact angle and IMC layer thickness, regardless of different fluxes. Relationship between contact angle and IMC layer thickness is found to have distinguished region because of different fluxes. Thus it may be used as guidance in flux selection for solder paste formulation.

However, detail composition of the fluxes was not further explored for the scope of this paper.

The quality of solder joint of SAC305/CNT/Cu system, as indicated by contact angle and the thickness of IMC layer formation, depends on existence of functional group of the fluxes.

Reflow solder joint quality is significantly affected by the ability of the solder to perfectly fill pad space and retain good solder joint shape. This study aims to investigate solder joint quality by quantitatively analyzing the stencil printing-deposited solder volume, solder height and solder coverage area.

The dispensability of different solder paste types on printed circuit board (PCB) pads using different stencil aperture shapes was evaluated. Lead-free Type 4 (20–38 µm particle size) and Type 5 (15–25 µm particle size) solder pastes were used to create solder joints according to standard reflow soldering.

The results show that the stencil aperture shape greatly affects the solder joint quality as compared with the type of solder paste. These investigations allow the development of new strategies for solving solder paste stencil printing issues and evaluating the quality of solder joints.

The reflow soldering process requires the appropriate selection of the stencil aperture shape according to the PCB and the solder paste according to the particle-size distribution of the solder alloy powder. However, there are scarce studies on the effects of stencil aperture shape and the solder alloy particle size on the solder paste space-filling ability.

This study aims to investigate the NiO nano-reinforced solder joint characteristics of ultra-fine electronic package.

Lead-free Sn-Ag-Cu (SAC) solder paste was mixed with various percentages of NiO nanoparticles to prepare the new form of nano-reinforced solder paste. The solder paste was applied to assemble the ultra-fine capacitor using the reflow soldering process. A focussed ion beam, high resolution transmission electron microscopy system equipped with energy dispersive X-ray spectroscopy (EDS) was used in this study. In addition, X-ray inspection system, field emission scanning electron microscopy coupled with EDS, X-ray photoelectron spectroscopy (XPS) and nanoindenter were used to analyse the solder void, microstructure, hardness and fillet height of the solder joint.

The experimental results revealed that the highest fillet height was obtained with the content of 0.01 Wt.% of nano-reinforced NiO, which fulfilled the reliability requirements of the international IPC standard. However, the presence of the NiO in the lead-free solder paste only slightly influenced the changes of the intermetallic layer with the increment of weighted percentage. Moreover, the simulation method was applied to observe the distribution of NiO nanoparticles in the solder joint.

The findings are expected to provide a profound understanding of nano-reinforced solder joint’s characteristics of the ultra-fine package.

The relationship between the bulk and localized mechanical properties is critically needed, especially to understand the mechanical performance of solder alloy because of smaller sizing trend of solder joint. The purpose of this paper is to investigate the relationship between tensile and nanoindentation tests toward the mechanical properties and deformation behavior of Sn-3.0Ag-0.5Cu (SAC305) lead-free solder wire at room temperature.

Tensile test with different strain rates of 1.5 × 10-4 s-1, 1.5 × 10-3 s-1, 1.5 × 10-2 s-1 and 1.5 × 10-1 s-1 at room temperature of 25°C were carried out on lead-free Sn-3.0Ag-0.5Cu (SAC305) solder wire. Stress–strain curves and mechanical properties such as yield strength (YS), ultimate tensile strength (UTS) and elongation were determined from the tensile test. Load-depth (P-h) profiles and micromechanical properties, namely, hardness and reduced modulus, were obtained from nanoindentation test. In addition, the deformation mechanisms of SAC305 lead-free solder wire were obtained by measuring the range of creep parameters, namely, stress exponent and strain rate sensitivity, using both of tensile and nanoindentation data.

It was observed that qualitative results obtained from tensile and nanoindentation tests can be used to identify the changes of the microstructure. The occurrence of dynamic recrystallization and the increase of ductility obtained from tensile test can be used to indicate the increment of grain refinement or dislocation density. Similarly, the occurrence of earliest pop-in event and the highest occurrence of pop-in event observed from nanoindentation also can be used to identify the increase of grain refinement and dislocation density. An increment of strain rates increases the YS and ultimate UTS of SAC305 solder wire. Similarly, the variation of hardness of SAC305 solder wire has the similar trend or linear relationship with the variation of YS and UTS, following the Tabor relation. In contrast, the variation of reduced modulus has a different trend compared to that of hardness. The deformation behavior analysis based on the Holomon’s relation for tensile test and constant load method for nanoindentation test showed the same trend but with different deformation mechanisms. The transition of responsible deformation mechanism was obtained from both tensile and nanoindentation tests which from grain boundary sliding (GBS) to grain boundary diffusion and dislocation climb to grain boundary slide, respectively.

For the current analysis, the relationship between tensile and nanoindentation test was analyzed specifically for the SAC305 lead-free solder wire, which is still lacking. The findings provide a valuable data, especially when comparing the trend and mechanism involved in bulk (tensile) and localized (nanoindentation) methods of testing.

The purpose of this paper is to investigate the relationship between microstructure and varied strain rates towards the mechanical properties and deformation behaviour of Sn-3.0Ag-0.5Cu (SAC305) lead-free solder wire at room temperature.

Tensile tests with different strain rates of 1.5 × 10⁻⁶, 1.5 × 10⁻⁵, 1.5 × 10⁻⁴, 1.5 × 10⁻³, 1.5 × 10⁻² and 1.5 × 10⁻¹ s⁻¹ at room temperature of 25°C were carried out on lead-free Sn-3.0Ag-0.5Cu (SAC305) solder wire. Stress-strain curves and mechanical properties such as yield strength, ultimate tensile strength and elongation were determined from the tensile tests. A microstructure analysis was performed by measuring the average grain size and the aspect ratio of the grains.

It was observed that higher strain rates showed pronounced dynamic recrystallization on the stress-strain curve. The increase in the strain rates also decreased the grain size of the SAC305 solder wire. It was found that higher strain rates had a pronounced effect on changing the deformation or shape of the grain in a longitudinal direction. An increase in the strain rates increased the tensile strength and ductility of the SAC solder wire. The primary deformation mechanism for strain rates below 1.5 × 10⁻¹ s⁻¹ was grain boundary sliding, whereas the deformation mechanism for strain rates of 1.5 × 10⁻¹ s⁻¹ was diffusional creep.

Most of the studies regarding the deformation behaviour of lead-free solder usually consider the effect of the elevated temperature. For the current analysis, the effect of the temperature is kept constant at room temperature to analyze the deformation of lead-free solder wire solely because of changes of strain rates, and this is the originality of this paper.

This paper aims to investigate the characteristics of ultra-fine lead-free solder joints reinforced with TiO₂ nanoparticles in an electronic assembly.

This study focused on the microstructure and quality of solder joints. Various percentages of TiO₂ nanoparticles were mixed with a lead-free Sn-3.5Ag-0.7Cu solder paste. This new form of nano-reinforced lead-free solder paste was used to assemble a miniature package consisting of an ultra-fine capacitor on a printed circuit board by means of a reflow soldering process. The microstructure and the fillet height were investigated using a focused ion beam, a high-resolution transmission electron microscope system equipped with an energy dispersive X-ray spectrometer (EDS), and a field emission scanning electron microscope coupled with an EDS and X-ray diffraction machine.

The experimental results revealed that the intermetallic compound with the lowest thickness was produced by the nano-reinforced solder with a TiO₂ content of 0.05 Wt.%. Increasing the TiO₂ content to 0.15 Wt.% led to an improvement in the fillet height. The characteristics of the solder joint fulfilled the reliability requirements of the IPC standards.

This study provides engineers with a profound understanding of the characteristics of ultra-fine nano-reinforced solder joint packages in the microelectronics industry.

The findings are expected to provide proper guidelines and references with regard to the manufacture of miniaturized electronic packages. This study also explored the effects of TiO₂ on the microstructure and the fillet height of ultra-fine capacitors.