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Excess Noise in Thick Film Resistors: Volume Dependence

A. Masoero, B. Morten, M. Tamborin, M. Prudenziati

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 May 1995

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Citation

Masoero, A., Morten, B., Tamborin, M. and Prudenziati, M. (1995), "Excess Noise in Thick Film Resistors: Volume Dependence", Microelectronics International, Vol. 12 No. 2, pp. 5-8. https://doi.org/10.1108/eb044556

Publisher

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Emerald Group Publishing Limited

Copyright © 1995, Emerald Group Publishing Limited

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