To read this content please select one of the options below:

$44.00 (excl. tax) 30 days to view and download

More scope for quality inspection of coatings

Pigment & Resin Technology

ISSN: 0369-9420

Article publication date: 1 May 1993

23

Abstract

Hitachi Scientific Instruments has launched a scanning electron microscope (SEM), which combines the convenience of an optical microscope with the high resolution of a top grade SEM. Whereas traditional SEMs only work at high vacuum, the ‘Universal’ SEM achieves outstanding resolution at low and high vacuums making it the most versatile multipurpose microscope available for quality inspection and advanced research of surface coatings, paints, pigments etc. It can be used to measure the thickness of coatings, determine faults and provide information for product improvement or trouble shooting.

Citation

(1993), "More scope for quality inspection of coatings", Pigment & Resin Technology, Vol. 22 No. 5, pp. 13-14. https://doi.org/10.1108/eb043068

Publisher

:

MCB UP Ltd

Copyright © 1993, MCB UP Limited

Related articles