Citation
(2008), "NPL's Chris Hunt picks up two awards at inaugural IPC Midwest Conference", Circuit World, Vol. 34 No. 1. https://doi.org/10.1108/cw.2008.21734aac.003
Publisher
:Emerald Group Publishing Limited
Copyright © 2008, Emerald Group Publishing Limited
NPL's Chris Hunt picks up two awards at inaugural IPC Midwest Conference
NPL's Chris Hunt picks up two awards at inaugural IPC Midwest Conference
The National Physical Laboratory's Dr Chris Hunt picked up two Distinguished Committee Service Awards during the recent IPC Midwest Conference held in Schaumburg, USA (Figure 4).
Chris was joined by other contributors for his work on the development of IPC- 9201A, Surface Insulation Resistance Handbook and also his contribution to the development of IPC-9691A, User Guide for the IPC-TM-650, Method 2.6.25, Conductive Anodic Filament (CAF) Resistance Test (Electrochemical Migration Testing).
Figure
4 NPL's Chris Hunt holding one of his Distinguished Committee Service Awards
presented at the IPC Midwest Conference
CAF, first reported in the 1980s, is a phenomenon seen within the weave of epoxy-glass PCA substrates, where a short circuit develops and causes circuit failure. The work by NPL with eight participating partners (two suppliers, three board assemblers, two users and a test equipment manufacturer) investigated the factors affecting CAF formation. CAF remains a challenge today, particularly in the automotive arena where the pressures of reduced pitch and cost, lead to difficult design choices and careful material selection.
These awards follow others that Chris has received over recent years on behalf of his excellent team at NPL based in Teddington, UK.