Flip chip solder joint reliability under harsh environment

Abstract

Flip chip solder joint reliability under thermal shock stress was investigated both experimentally and by 2D finite element simulation. The results indicate that solder fatigue is the dominant failure mode and that delamination has obvious adverse effects on the solder joint lifetime. Different material/process combinations (underfill, flux, reflow atmospheres) were designed in order to understand the role of material/process factors on the solder joint lifetime and the results are discussed.

Citation

Bo, C., Li, W., Qun, Z., Xia, G., Xiaoming, X. and Kempe, W. (2003), "Flip chip solder joint reliability under harsh environment", Soldering & Surface Mount Technology, Vol. 15 No. 3, pp. 15-20. https://doi.org/10.1108/09540910310505071