Hybridization of volumetric and surface models for the computation of the T/R EC probe response due to a thin opening flaw
ISSN: 0332-1649
Article publication date: 4 January 2008
Abstract
Purpose
The purpose of this paper is to describe the development of simulation tools dedicated to eddy current non destructive testing (ECNDT) on planar structures implying planar defects. Two integral approaches using the Green dyadic formalism are considered.
Design/methodology/approach
The surface integral model (SIM) is dedicated to ideal cracks, whereas the volume integral method is adapted to general volumetric defects.
Findings
The authors observed that SIM provides satisfactory results, except in some critical transmitting/receiving (T/R) configurations. This led us to propose a hybrid method based on the combination of the two previous ones.
Originality/value
This method enables to simulate ECNDT on planar structures implying defects with a small opening using T/R probes.
Keywords
Citation
Maurice, L., Prémel, D., Pávó, J., Lesselier, D. and Nicolas, A. (2008), "Hybridization of volumetric and surface models for the computation of the T/R EC probe response due to a thin opening flaw", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 27 No. 1, pp. 298-306. https://doi.org/10.1108/03321640810836852
Publisher
:Emerald Group Publishing Limited
Copyright © 2008, Emerald Group Publishing Limited