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In profile monitoring, which is a growing research area in the field of statistical process control, the relationship between response and explanatory variables is monitored over time. The purpose of this paper is to focus on the process capability analysis of linear profiles. Process capability indices give a quick indication of the capability of a manufacturing process.

In this paper, the proportion of the non‐conformance criteria is employed to estimate process capability index. The paper has considered the cases where specification limits is constant or is a function of explanatory variable X. Moreover, cases where both equal and random design schemes in profile data acquisition is required (as the explanatory variable) is considered. Profiles with the assumption of deterministic design points are usually used in the calibration applications. However, there are other applications where design points within a profile would be i.i.d. random variables from a given distribution.

Simulation studies using simple linear profile processes for both fixed and random explanatory variable with constant and functional specification limits are considered to assess the efficacy of the proposed method.

There are many cases in industries such as semiconductor industries where quality characteristics are in form of profiles. There is no method in the literature to analyze process capability for theses processes, however recently quite a few methods have been presented in monitoring profiles. Proposed methods provide a framework for quality engineers and production engineers to evaluate and analyze capability of the profile processes.