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This paper aims to study the influence of the Cu-Al₂O₃ film-coated Cu substrate as a thermal interface material (TIM) on the thermal and optical behaviour of the light-emitting diode (LED) package and the annealing effect on the thermal and optical properties of the films.

A layer-stacking technique has been used to deposit the Cu-Al₂O₃ films by means of magnetron sputtering, and the annealing process was conducted on the synthesized films.

In this paper, it was found that the un-annealed Cu-Al₂O₃–coated Cu substrate exhibited low value of thermal resistance compared to the bare Cu substrate and to the results of previous works. Also the annealing effect does not have a significant impact on the changes of properties of the films.

It is deduced that the increase of the Cu layer thickness can further improve the thermal properties of the deposited film, which can reduce the thermal resistance of the package in system-level analysis.

The paper suggested that the Cu-Al₂O₃–coated Cu substrate can be used as alternative TIM for the thermal management of the application of LEDs.

In this paper, the Cu substrate has been used as the substrate for the Cu-Al₂O₃ films, as the Cu substrate has higher thermal conductivity compared to the Al substrate as shown in previous work.

Proper thermal management is a key to improve the efficiency and reliability of light-emitting diodes (LEDs). This paper aims to report the influence of applying thermally conductive materials on thermal performance of indium gallium aluminum phosphide (InGaAlP)-based thin-film surface-mounted device (SMD) LED.

The LED thermal and optical parameters were determined using the combination of thermal transient tester (T3Ster) and thermal and radiometric characterization of power LEDs (TeraLED) instruments. The LED was mounted on FR4, 2W and 5W aluminum (Al) package substrates. Measurements were carried out by setting different boundary conditions: air between LED package and substrate and using thermally conductive epoxy (TIM A) and adhesive (TIM B) of thermal conductivity 1.67 and 1.78 W/mK, respectively.

For LED mounted on FR4 package, the total real thermal resistance is improved because of TIM B by 6 and 9 per cent at 50 and 100 mA, respectively. Likewise, the relative decrease in total thermal resistance of LED on 2W Al package is about 9 and 11 per cent. As well, for LED mounted on 5W Al package, the total real thermal resistance is reduced by 2 and 4 per cent.

No much work can be found in the literature on thermal interface material effects on thermal performance of low-power SMD LED. This work can assist in thermal management of low-power LEDs.

Polymer-based thermal interface materials (TIMs) are having pump out problem and could be resolved for reliable application. Solid-based interface materials have been suggested and reported. The purpose of this paper is suggesting thin film-based TIM to sustain the light-emiting diode (LED) performance and electronic device miniaturization.

Consequently, ZnO thin film at various thicknesses was prepared by chemical vapour deposition (CVD) method and tested their thermal behaviour using thermal transient analysis as solid TIM for high-power LED.

Low value in total thermal resistance (R_th-tot) was observed for ZnO thin film boundary condition than bare Al boundary condition. The measured interface (ZnO thin film) resistance {(R_th-bhs) thermal resistance of the interface layer (thin film) placed between metal core printed circuit board (MCPCB) board and Al substrates} was nearly equal to Ag paste boundary condition and showed low values for ZnO film prepared at 30 min process time measured at 700 mA. The T_J value of LED mounted on ZnO thin film (prepared at 30 min.) coated Al substrates was measured to be 74.8°C. High value in junction temperature difference (ΔT_J) of about 4.7°C was noticed with 30 min processed ZnO thin film when compared with Al boundary condition. Low correlated colour temperature and high luminous flux values of tested LED were also observed with ZnO thin film boundary condition (processed at 30 min) compared with both Al substrate and Ag paste boundary condition.

Overall, 30 min CVD processed ZnO thin film would be an alternative for commercial TIM to achieve efficient thermal management. This will increase the life span of the LED as the proposed material decreases the T_J values.

Thermal behavior of light-emitting diode (LED) device under different operating conditions must be known to enhance its reliability and efficiency in various applications. The purpose of this study is to report the influence of input current and ambient temperature on thermal resistance of InGaAlP low-power surface-mount device (SMD) LED.

Thermal parameters of the LED were measured using thermal transient measurement via Thermal Transient Tester (T3Ster). The experimental results were validated using computational fluid dynamics (CFD) software.

As input current increases from 50 to 90 mA at 25°C, the relative increase in LED package (ΔR_thJS) and total thermal resistance (ΔR_thJA) is about 10 and 4 per cent, respectively. In addition, at 50 mA and ambient temperature from 25 to 65°C, the ΔR_thJS and ΔR_thJA are roughly 28 and 22 per cent, respectively. A good agreement between simulation and experiment results of junction temperature.

Most of previous studies have focused on thermal management of high-power LEDs. There were no studies on thermal analysis of low-power SMD LED so far. This work will help in predicting the thermal performance of low-power LEDs in solid-state lighting applications.

Thermal management of high-power (HP) light-emitting diodes (LEDs) is an essential issue. Junction temperature (T_J) and thermal resistance (R_th) are critical parameters in evaluating LEDs thermal management and reliability. The purpose of this paper is to study thermal and optical characteristics of ThinGaN (UX:3) white LED mounted on SinkPAD by three types of solder paste (SP): No-Clean SAC305 (SP1), Water-Washable SAC305 (SP2) and No-Clean Sn42/Bi57.6/Ag0.4 (SP3).

Thermal transient tester (T3Ster) machine is used to determine T_J and total thermal resistance (R_th–JA). In addition, the LED’s optical properties are measured via thermal and radiometric characterization of power LEDs (TeraLED) system. The LED is mounted on SinkPAD using SP1, SP2 and SP3 by stencil printing to control a thickness of SP and reflow soldering oven to minimize the number of voids. The LED with SP1, SP2 and SP3 is tested at various input currents and ambient temperatures.

The results indicate that at high input current, which equals to 1,200 mA, R_th–JA and T_J, respectively, are reduced by 30 and 17 per cent between SP1 and SP2. At same current value, R_th–JA and T_J are minimized by 42 and 25 per cent between SP1 and SP3, respectively. In addition, at an ambient temperature of 85°C, R_th–JA and T_J are decreased by 34 and 7 per cent between SP1 and SP2, respectively. Similarly, the reduction in R_th–JA and T_J between SP1 and SP3 is 44 and 10 per cent, respectively. Luminous flux, luminous efficacy and color shift of the LED with the three types of SPs are compared and discussed. It is found that the SP1 improves the chromatic properties of the LED by increasing the overall light efficiency and decreasing the color shift.

Thermal and optical performance of ThinGaN LEDs mounted on SinkPAD via three types of SPs is compared. This investigation can assist the research on thermal management of HP ThinGaN-based LEDs.

Light emitting diode (LED) has been the best resource for commercial and industrial lighting applications. However, thermal management in high power LEDs is a major challenge in which the thermal resistance (R_th) and rise in junction temperature (T_J) are critical parameters. The purpose of this work is to evaluate the R_th and T_j of the LED attached with the modified heat transfer area of the heatsink to improve thermal management.

This paper deals with the design of metal substrate for heatsink applications where the surface area of the heatsink is modified. Numerical simulation on heat distribution proved the influence of the design aspects and surface area of heatsink.

T_J was low for outward step design when compared to flat heatsink design (ΔT ∼ 38°C) because of increase in surface area from 1,550 mm² (flat) to 3,076 mm² (outward step). On comparison with inward step geometry, the T_J value was low for outward step configuration (ΔT_J ∼ 6.6°C), which is because of efficient heat transfer mechanism with outward step design. The observed results showed that outward step design performs well for LED testing by reducing both R_th and T_J for different driving currents.

This work is authors’ own design and also has the originality for the targeted application. To the best of the authors’ knowledge, the proposed design has not been tried before in the electronic or LED applications.

One major problem in the lighting industry is the thermal management of the devices. Handling of thermal resistance from solder point to the ambiance of the light-emitting diode (LED) package is linked to the external thermal management that includes a selection of the cooling mode, design of heatsink/substrate and thermal interface material (TIM). Among the significant factors that increase the light output of the of the LED system are efficient substrate and TIM. In this work, the influence of TIM on the luminous flux performance of commercial indium gallium aluminium phosphide (InGaAlP) low-power (LP) LEDs was investigated.

One batch of LEDs was mounted directly onto substrates which were glass-reinforced epoxy (FR4) and aluminium-based metal-core printed circuit boards (MCPCBs) with a dielectric layer of different thermal conductivities. Another batch of LEDs was prepared in a similar way, but a layer of TIM was embedded between the LED package and substrate. The TIMs were thermally conductive epoxy (TCE) and thermally conductive adhesive (TCA). The LED parameters were measured by using the integrated system of thermal transient tester (T3Ster) and thermal-radiometric characterization of LEDs at various input currents.

With the employment of TIM, the authors found that the LED’s maximum luminous flux was significantly higher than the value mentioned in the LED datasheet, and that a significant reduction in thermal resistance and junction temperature was revealed. The results showed that for a system with low thermal resistance, the maximum luminous flux appeared to occur at a higher power level. It was found that the maximum luminous flux was 24.10, 28.40 and 36.00 lm for the LEDs mounted on the FR4 and two MCPCBs, respectively. After TCA application on the LEDs, the maximum luminous flux values were 32.70, 36.60 and 37.60 lm for the FR4 and MCPCBs, respectively. Moreover, the findings demonstrated that the performance of the LED mounted on the FR4 substrate was more affected by the employment of the TIM than that of MCPCBs.

One of the major problems in the lighting industry is the thermal management of the device. In many low-power LED applications, the air gap between the two solder pads is not filled up. Heat flow is restricted by the air gap leading to thermal build-up and higher thermal resistance resulting in lower maximum luminous flux. Among the significant factors that increase the light output of the LED system are efficient substrate and TIM.

The findings in this work can be used as a method to improve thermal management of LP LEDs by applying thermal interface materials that can offer more efficient and brighter LP LEDs. Using aluminium-based substrates can also offer similar benefits.

Users of LP LEDs can benefit from the findings in this work. Brighter automotive lighting (signalling and backlighting) can be achieved, and better automotive lighting can offer better safety for the people on the street, especially during raining and foggy weather. User can also use a lower LED power rating to achieve similar brightness level with LED with higher power rating.

Better thermal management of commercial LP LEDs was achieved with the employment of thermal interface materials resulting in lower thermal resistance, lower junction temperature and brighter LEDs.

Optimization of light-emitting diodes’ (LEDs’) design together with long-term reliability is directly correlated with their photometric, electric and thermal characteristics. For a given thermal layout of the LED system, the maximum luminous flux occurs at an optimal electrical input power and can be determined using a photo-electro-thermal (PET) theory. The purpose of this study is to extend the application of the luminous flux equation in PET theory for low-power (LP) LEDs.

LP surface-mounted device LEDs were mounted on substrates of different thermal resistances. Three LEDs were attached to substrates which were flame-retardant fiberglass epoxy (FR4) and two aluminum-based metal core printed circuit boards (MCPCBs) with thermal conductivities of about 1.0 W/m.K, 2.0 W/m.K and 5.0 W/m.K, respectively. The conjunction of thermal transient tester and thermal and radiometric characterization of LEDs system was used to measure the thermal and optical parameters of the LEDs at a certain range of input current and temperature.

The validation of the extended application of the luminous flux equation was confirmed via a good agreement between the practical and theoretical results. The outcomes show that the optimum luminous flux is 25.51, 31.91 and 37.01 lm for the LEDs on the FR4 and the two MCPCBs, respectively. Accordingly, the stipulated maximum electrical input power in the LED datasheet (0.185 W) is shifted to 0.6284, 0.6963 and 0.8838 W between the three substrates.

Using a large number of LP LEDs is preferred than high-power (HP) LEDs for the same system power to augment the heat transfer and provide a higher luminous flux. The PET theory equations have been applied to HP LEDs using heatsinks with various thermal resistances. In this work, the PET theory luminous flux equation was extended to be used for Indium Gallium Aluminum Phosphide LP LEDs attached to the substrates with dissimilar thermal resistances.

The presence of voids in the solder layer has been considered as one of the main issues causing reliability problems in optoelectronic devices. Voids can be created due to trapped gas, clean-up agent residues (fluxes), poor wettability at interface or shortcoming of the reflow process. The voids hinder the heat conduction path and subsequently, the thermal resistance will increase. The purpose of this paper is to investigate the influence of lead-free water-washable Sn96.5Ag3.0Cu0.5 (SAC305) solder paste (SP) voids on the thermal and optical performance of white high-power (HP) surface-mounted device (SMD) light-emitting diode (LED).

Five LEDs are mounted on five SinkPAD substrates by using the SP. The SMT stencil printing is used to control the thickness of the SP and reflow oven for the soldering process. The fraction of voids in the SP layer is calculated using the X-ray machine software. The thermal parameters of the LEDs with different voids fraction and configuration are measured using a thermal transient tester (T3Ster) system. In addition, the optical characterizations of the LEDs are determined by the thermal and radiometric characterization of power LEDs (TeraLED) and the electroluminescence by using the spectrometer.

The results showed that the thermal performance and temperature distribution are improved for the LED with lower voids fraction and good filling state of soldering. In addition, luminous flux, efficacy and color shift of the LEDs with different fraction and configurations of voids on the SP layer are compared and discussed. It is found that the color shift of LED1 of low voids fraction and higher thickness are less than other LEDs.

The paper provides valuable information about the effect of water-washable SAC305 SP voids fraction and filling state of solder on the thermal and optical performance of ThinGaN HP SMD LED. A comprehensive overview of the outcomes is not available in the literature. It was shown experimentally that the voids fraction, height and configuration of the SP layer could strongly influence the heat dissipation efficiency and thermal resistance. This study can help in heat diffusion investigation and failure analysis of HP SMD LEDs.

The purpose of this research is to study the effect of thickness and surface properties of ZnO solid thin film for heat dissipation application in LED. Heat dissipation in electronic packaging can be improved by applying a thermally conductive interface material (TIM) and hence the junction temperature will be maintained. ZnO is one of the oxide materials and used as a filler to increase the thermal conductivity of thermal paste. The thickness of these paste-type material cannot be controlled which restricts the heat flow from the LED junction to ambient. The controlled thickness is only possible by using a solid thin-film interface material.

Radio Frequency (RF)-sputtered ZnO thin film on Cu substrates were used as a heat sink for high-power LED and the thermal performance of various ZnO thin film thickness on changing total thermal resistance (R _th-tot) and rise in junction temperature were tested. Thermal transient analysis was used to study the performance of the given LED. The influence of surface roughness profile was also tested on the LED performance.

The junction temperature was high (6.35°C) for 200 nm thickness of ZnO thin film boundary condition when compared with bare Cu substrates. Consecutively, low R _th-tot values were noticed with the same boundary condition. The 600 nm thickness of ZnO thin film exhibited high R _th-tot and interface resistance than the other thicknesses. Bond Line Thickness of the interface material was influenced on the interface thermal resistance which was decreased with increased BLT. Surface roughness parameter showed an immense effect on thermal transport, and hence, low R _th (47.6 K/W) value was noticed with low film roughness (7 nm) as compared with bare Cu substrate (50.8 K/W) where the surface roughness was 20.5 nm.

Instead of using thermal paste, solid thin film ZnO is used as TIM and coated Cu substrates were used as a heat sink. The thickness can be controlled, and it is a new approach for reducing the BLT between the metal core printed circuit board and heat sink.