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This study aims to investigate the interaction of independent variables [Reynolds number (Re), thermal power and the number of ball grid array (BGA) packages] and the relation of the variables with the responses [Nusselt number ((Nu) ¯ ), deflection/FPCB’s length (d/L) and von Mises stress]. The airflow and thermal effects were considered for optimizing the Re of various numbers of BGA packages with thermal power attached on flexible printed circuit board (FPCB) for optimum cooling performance with least deflection and stress by using the response surface method (RSM).

Flow and thermal effects on FPCB with heat source generated in the BGA packages have been examined in the simulation. The interactive relationship between factors (i.e. Re, thermal power and number of BGA packages) and responses (i.e. deflection over FPCB length ratio, stress and average Nusselt number) were analysed using analysis of variance. RSM was used to optimize the Re for the different number of BGA packages attached to the FPCB.

It is important to understand the behaviour of FPCB when exposed to both flow and thermal effects simultaneously under the operating conditions. Maximum d/L and von Misses stress were significantly affected by all parametric factors whilst (Nu)¯ is significantly affected by Re and thermal power. Optimized Re for 1–3 BGA packages with maximum thermal power applied has been identified as 21,364, 23,858 and 29,367, respectively.

This analysis offers a better interpretation of the parameter control in FPCB with optimized Re for the use of force convection electronic cooling. Optimal Re could be used as a reference in the thermal management aspect in designing the BGA package.

This research presents the parameters’ effects on the reliability and heat transfer in FPCB design. It also presents a method to optimize Re for the different number of BGA packages attached to increase the reliability in FPCB’s design.

The purpose of this study is to investigate the effect of the adhesive force and density ratio using lattice Boltzmann method (LBM) during underfill process.

To deal with complex flow in underfill process, a framework is proposed to improve the lattice Boltzmann equation. The fluid flows with different density ratio and bump arrangement in underfill are simulated by the incorporated Carnahan–Starling (CS) equation of state (EOS). The numerical study conducted by finite volume method (FVM) and experimental results are also presented in each case at the different filling percentage for verification and validation purpose.

The numerical result is compared well with those acquired experimentally. Small discrepancy is detected in their flow profile. It was found that the adhesive force between fluid and solid was affected by the density ratio of the fluids and solder bump configuration. LBM has shown better adhesive force effect phenomenon on underfill process compared to FVM. LBM also demonstrated as a better tool to study the fluid flow in the underfill process.

This study provides a basis and insights into the impact of adhesive force and density ratio to the underfill process that will be advancing the future design of flip chip package. This study also provides superior guidelines, and the knowledge of how adhesive force is affected by flip chip package structure.

This study proposes the method to predict the adhesive force and density ratio effect for underfill flow in flip chip package. In addition, the proposed method has a good performance in representing the adhesive force during the underfill simulation for its natural physical basic. This study develops understanding of flow problems to attain high reliability for electronic assemblies.

The purpose of this paper is to present the experimental and simulation studies on the influence of copper pillar bump structure on flip chip packaging during reflow soldering.

In this work, solidification/melting modelling and volume of fluid modelling were used. Reflow soldering process of Cu pillar type FC was modelled using computational fluid dynamic software (FLUENT). The experimental results have been validated with the simulation results to prove the accuracy of the numerical method.

The findings of this study reveal that solder volume is the most important element influencing reflow soldering. The solder cap volume reduces as the Cu pillar bump diameter lowers, making the reflow process more difficult to establish a good solder union, as less solder is allowed to flow. Last but not least, the solder cap height for the reflow process must be optimized to enable proper solder joint formation.

This study provides a basis and insights into the impact of copper pillar bump structure on flip chip packaging during reflow soldering that will be advancing the future design of 3D stack package. This study also provides a superior visualization and knowledge of the melting and solidification phenomenon during the reflow soldering process.

The computational fluid dynamics analysis of copper pillar bump structure on flip chip packaging during reflow soldering is scant. To the authors’ best knowledge, no research has been concentrated on copper pillar bump size configurations in a thorough manner. Without the in-depth study, copper pillar bump size might have the impact of copper pillar bump structure on flip chip packaging during reflow soldering. Five design of parameter of flip chip IC package model was proposed for the investigation of copper pillar bump structure on flip chip packaging during reflow soldering.

The aim of this study is to investigate the effects of offset angle in wave soldering by using thermal fluid structure interaction modeling with experimental validation.

The authors used a thermal coupling approach that adopted mesh-based parallel code coupling interface between finite volume-and finite element-based software (ABAQUS). A 3D single pin-through-hole (PTH) connector with five offset angles (0 to 20°) on a printed circuit board (PCB) was built and meshed by using computational fluid dynamics preprocessing software called GAMBIT. An implicit volume of fluid technique with a second-order upwind scheme was also applied to track the flow front of solder material (Sn63Pb37) when passing through the solder pot during wave soldering. The structural solver and ABAQUS analyzed the temperature distribution, displacement and von Mises stress of the PTH connector. The predicted results were validated by the experimental solder profile.

The simulation revealed that the PTH offset angle had a significant effect on the filling of molten solder through the PCB. The 0° angle yielded the best filling profile, filling time, lowest displacement and thermal stress. The simulation result was similar to the experimental result.

This study provides a better understanding of the process control in wave soldering for PCB assembly.

This study provides fundamental guidelines and references for the thermal coupling method to address reliability issues during wave soldering. It also enhances understanding of capillary flow and PTH joint issues to achieve high reliability in PCB assembly industries.