Search results

1 – 2 of 2
Per page
102050
Citations:
Loading...
Access Restricted. View access options
Article
Publication date: 3 January 2017

Peyman Rafiee, Golta Khatibi and Michael Zehetbauer

The purpose of this paper is to provide an overview of the major reliability issues of microelectromechanical systems (MEMS) under mechanical and environmental loading conditions…

1155

Abstract

Purpose

The purpose of this paper is to provide an overview of the major reliability issues of microelectromechanical systems (MEMS) under mechanical and environmental loading conditions. Furthermore, a comprehensive study on the nonlinear behavior of silicon MEMS devices is presented and different aspects of this phenomenon are discussed.

Design/methodology/approach

Regarding the reliability investigations, the most important failure aspects affecting the proper operation of the MEMS components with focus on those caused by environmental and mechanical loads are reviewed. These studies include failures due to fatigue loads, mechanical vibration, mechanical shock, humidity, temperature and particulate contamination. In addition, the influence of squeeze film air damping on the dynamic response of MEMS devices is briefly discussed. A further subject of this paper is discussion of studies on the nonlinearity of silicon MEMS. For this purpose, after a description of the basic principles of nonlinearity, the consequences of nonlinear phenomena such as frequency shift, hysteresis and harmonic generation and their effects on the device performance are reviewed. Special attention is paid to the mode coupling effect between the resonant modes as a result of energy transfer because of the nonlinearity of silicon. For a better understanding of these effects, the nonlinear behavior of silicon is demonstrated by using the example of Si cantilever beams.

Findings

It is shown that environmental and mechanical loads can influence on proper operation of the MEMS components and lead to early fracture. In addition, it is demonstrated that nonlinearity modifies dynamic response and leads to new phenomena such as frequency shift and mode coupling. Finally, some ideas are given as possible future areas of research works.

Originality/value

This is a review paper and aimed to review the latest manuscripts published in the field of reliability and nonlinearity of the MEMS structures.

Details

Microelectronics International, vol. 34 no. 1
Type: Research Article
ISSN: 1356-5362

Keywords

Access Restricted. View access options
Book part
Publication date: 12 September 2007

Orly Levy, Sully Taylor, Nakiye A. Boyacigiller and Schon Beechler

In this section, we offer a careful and systematic review of the theoretical and empirical studies relating to global mindset that have been published in books and peer-reviewed…

Abstract

In this section, we offer a careful and systematic review of the theoretical and empirical studies relating to global mindset that have been published in books and peer-reviewed journals. This review includes studies that use differing terms to refer to the idea of global mindset but consider the same general concept. At the same time, we exclude studies that do not specifically pertain to global mindset but concentrate on such areas as global leadership, expatriates, and expatriation, even though they may focus on similar underlying themes found in the global mindset literature. We then identify two fundamental themes in the global mindset literature – cosmopolitanism and cognitive complexity – and use these concepts to develop a new integrative approach to global mindset.

Details

The Global Mindset
Type: Book
ISBN: 978-0-7623-1402-7

1 – 2 of 2
Per page
102050