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The purpose of this paper is to investigate the effect of different viscosity models (Cross and Al-Ma’aiteh) and different printing speeds on the numerical results (e.g. pressure over stencil) of a numerical model regarding stencil printing.

A finite volume model was established for describing the printing process. Two types of viscosity models for non-Newtonian fluid properties were compared. The Cross model was fitted to the measurement results in the initial state of a lead-free solder paste, and the parameters of a Al-Ma’aiteh material model were fitted in the stabilised state of the same paste. Four different printing speeds were also investigated from 20 to 200 mm/s.

Noteworthy differences were found in the pressure between utilising the Cross model and the Al-Ma’aiteh viscosity model. The difference in pressure reached 33-34% for both printing speeds of 20 and 70 mm/s and reached 31% and 27% for the printing speed of 120 and 200 mm/s. The variation in the difference was explained by the increase in the rates of shear by increasing printing speeds.

Parameters of viscosity model should be determined for the stabilised state of the solder paste. Neglecting the thixotropic paste nature in the modelling of printing can cause a calculation error of even approximately 30%. By using the Al-Ma’aiteh viscosity model over the stabilised state of solder pastes can provide more accurate results in the modelling of printing, which is necessary for the effective optimisation of this process, and for eliminating soldering failures in highly integrated electronic devices.

A measurement method has been developed to reveal the viscosity change of solder pastes during stencil printing. This paper aimed to investigate thixotropic behaviour, the viscosity change of a lead-free solder paste (Type 4).

The viscosity change of the solder paste during stencil printing cycles was characterised in such a way that the time-gap between the printing cycles was modelled with a rest period between every rheological measurement. This period was set as 15, 30 and 60 s during the research. The Cross model was fitted to the measurement results, and the η₀ parameter was used to characterise the viscosity change. The number of printing cycles necessary for reaching a stationary state in viscosity was determined for various rest periods.

It was found that the decrease in zero-shear viscosity is significant (25 per cent) in the first cycles, and it starts to become stationary at the sixth-seventh cycles. This means a printing process can provide the appropriate deposits only after the 7th cycle with the investigated Type 4 solder paste.

Time-dependent rheological behaviour of solder pastes was studied in the literature, but only the viscosity change over continuous time at constant shear rates was examined. The time-gap between stencil printing cycles was not considered, and thixotropic behaviour of solder pastes was also neglected. Therefore, the authors developed a measurement set which is able to model the effect of time-gap between printing cycles on the viscosity change of solder pastes.

The vacuum vapour phase soldering method was investigated by numerical simulations. The purpose of this study was to examine the temperature changes of the solder joints during the vapour suctioning process. A low pressure is used to enhance the outgassing of the trapped gas within the solder joints, which otherwise could form voids. However, the system loses heat near the suction pipe during the suctioning process, and it can result in preliminary solidification of the solder joints before the gas could escape.

A three-dimensional numerical flow model based on the Reynolds averaged Navier–Stokes equations with the standard k-e turbulence method was developed. The effect of the vapour suctioning on the convective heat transfer mechanism was described by the model. Temperature change of the solder joints was studied at the mostly used substrate and component combinations, as well as at different system settings.

In the function of the substrate thickness and the component size, the solder joints can lose large amount of heat during the void reduction process, which leads to preliminary solidification before the entrapped gas voids could be removed.

The results provide setting information of vacuum vapour phase technology for appropriate and optimal applications.

The relationship between low pressure generation and convective heat transfer mechanism during vacuum vapour phase soldering has not been studied yet. The possible negative effects of the vapour suctioning process on the solder joint temperature are unknown.

The aim of this paper is to present a review of the tin whisker growth phenomena. The study focuses mainly on whisker growth in a corrosive climate when the main inducing factor of the whisker growth is oxidation. The tin whisker phenomenon is still a big challenge in lead-free reflow soldering technology. Modern lead-free alloys and surface finishes with high tin content are considered to be possible sources of whisker development, also the evolution of electronic devices towards further complexity and miniaturization points to an escalation of the reliability risks.

The present work was based on a worldwide literature review of the substantial previous works in the past decade, as well as on the results and experience of the authors in this field.

The effect of corrosion on tin whisker growth has been under-represented in reports of mainstream research; however, in the past five years, significant results were obtained in the field which raised the corrosion phenomena from being a side effect category into one of the main inducing factors. This paper summarizes the most important findings of this field.

This literature review provides engineers and researchers with a better understanding of the role of corrosion in tin whisker growth and the current challenges in tin whisker mitigation.

The unique challenges and future research directions about the tin whisker phenomenon were shown to highlight rarely discussed risks and problems in lead-free soldering reliability.

This paper aims to present a new method to calculate the appropriate volume of solder paste necessary for the pin-in-paste (PIP) technology. By the aid of this volume calculation, correction factors have been determined, which can be used to correct the solder fillet volume obtained by an explicit expression.

The method is based on calculating the optimal solder fillet shape and profile for through-hole (TH) components with given geometrical sizes. To calculate this optimal shape of the fillet, a script was written in Surface Evolver. The volume calculations were performed for different fillet radiuses (0.4-1.2 mm) and for different component lead geometries (circular and square cross-sections). Finally, the volume obtained by the Evolver calculations was divided by the volume obtained by an explicit expression, and correction factors were determined for the varying parameters.

The results showed that the explicit expression underestimates the fillet volume necessary for the PIP technology significantly (15-35 per cent). The correction factors for components with circular leads ranged between 1.4 and 1.59, whereas the correction factors for square leads ranged between 1.1 and 1.27. Applying this correction can aid in depositing the appropriate solder paste volume for TH components.

Determining the correct volume of solder paste necessary for the PIP technology is crucial to eliminate the common soldering failure of TH components (e.g. voiding or non-wetted solder pads). The explicit expression, which is widely used for volume calculation in this field, underestimates the necessary volume significantly. The new method can correct this estimation, and can aid the industry to approach zero-defect manufacturing in the PIP technology.

The purpose of this paper is to increase the reliability of manufactured electronics and to reveal reliability significant factors. The experiments were focused especially on the influence of the reflow oven parameters presented by a heating factor.

The shear strength of the surface mount device (SMD) resistors and their joint resistance were analyzed. The resistors were assembled with two Sn/Ag/Cu-based and one Bi-based solder pastes, and the analysis was done for several values of the heating factor and before and after isothermal aging. The measurement of thickness of intermetallic compounds was conducted on the micro-sections of the solder joints.

The shear strength of solder joints based on the Sn/Ag/Cu-based solder alloy started to decline after the heating factor reached the value of 500 s · K, whereas the shear strength of the solder alloy based on the Bi alloy (in the measured range) always increased with an increase in the heating factor. Also, the Bi-based solder joints showed shear strength increase after isothermal aging in contrast to Sn/Ag/Cu-based solder joints, which showed shear strength decrease.

The interpretation of the results of such a comprehensive measurement leads to a better understanding of the mutual relation between reliability and other technological parameters such as solder alloy type, surface finish and parameters of the soldering process.

The purpose of this paper is to verify how solder joint properties correlate with soldering profile set-up. These characteristics act against each other. All observed properties may significantly affect the quality and reliability of solder joints. The purpose is also to design recommendations for manufacturers of electronic assemblies.

The samples for experiment were reflowed by using a laboratory reflow oven. A LEXT laser confocal microscope was used for wetting angle and intermetallic compound (IMC) thickness measurement. The ionic contamination was measured by using a contaminometer.

The appropriate choice of soldering profile is very important for the reliability of electronic assemblies. The higher temperatures or longer preheating and soldering times improve the wetting angle. Likewise, there is also the activation of all the fluxes. The result is low contamination with printed circuit boards (PCBs). On the other hand, we must not forget that higher temperatures and longer soldering time also affect the thickness of the IMC. The outer limits recommended by the manufacturer were selected for the soldering profile set-up. Even within these limits, it is possible to achieve an improvement in the wetting angle, an improvement in levels of PCB contamination and an increase in the thickness of the IMC. This paper presents the results achieved for solders Sn42Bi57.6Ag0.4, Sn96.5Ag3Cu0.5 and Sn97Ag3.

The gained knowledge on the correlation between IMC thickness, solderability of PCB and PCB contamination caused by different soldering profile set-ups can help to prevent reliability problems because each of the named effects has a significant influence on reliability.