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Article
Publication date: 2 January 2018

Jeh-Nan Pan, Chung-I Li and Jun-Wei Hsu

The purpose of this paper is to provide a new approach for detecting the small sustained process shifts in multistage systems with correlated multiple quality characteristics.

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Abstract

Purpose

The purpose of this paper is to provide a new approach for detecting the small sustained process shifts in multistage systems with correlated multiple quality characteristics.

Design/methodology/approach

The authors propose a new multivariate linear regression model for a multistage manufacturing system with multivariate quality characteristics in which both the auto-correlated process outputs and the correlations occurring between neighboring stages are considered. Then, the multistage multivariate residual control charts are constructed to monitor the overall process quality of multistage systems with multiple quality characteristics. Moreover, an overall run length concept is adopted to evaluate the performances of the authors’ proposed control charts.

Findings

In the numerical example with cascade data, the authors show that the detecting abilities of the proposed multistage residual MEWMA and MCUSUM control charts outperform those of Phase II MEWMA and MCUSUM control charts. It further demonstrates the usefulness of the authors’ proposed control charts in the Phase II monitoring.

Practical implications

The research results of this paper can be applied to any multistage manufacturing or service system with multivariate quality characteristics. This new approach provides quality practitioners a better decision making tool for detecting the small sustained process shifts in multistage systems.

Originality/value

Once the multistage multivariate residual control charts are constructed, one can employ them in monitoring and controlling the process quality of multistage systems with multiple characteristics. This approach can lead to the direction of continuous improvement for any product or service within a company.

Details

International Journal of Quality & Reliability Management, vol. 35 no. 1
Type: Research Article
ISSN: 0265-671X

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Article
Publication date: 3 April 2018

Pengpeng Sun, Hui Liu, Miao Geng, Rong Zhang, Tingting Yuan and Wei Jun Luo

The design and performance of X-band high power 3-bit phase shifter which has been fabricated in 0.25µm GaN HEMT technology are presented.

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Abstract

Purpose

The design and performance of X-band high power 3-bit phase shifter which has been fabricated in 0.25µm GaN HEMT technology are presented.

Design/methodology/approach

Each bit of this phase shifter design is based on high-pass/low-pass topology.

Findings

For all eight states, the insertion loss is 12.5 ± 2.5 dB from 8-10 GHz and the input return loss is better than 9 dB over 8-10 GHz. The 3-bit phase shifter achieves a RMS phase error of 1o at 8.5 GHz and a RMS amplitude error less than 1.1dB. The measured continuous wave power data demonstrates typical input RF power handing capability of 32 dBm at 8 GHz.

Originality/value

This is to the authors’ knowledge the first published results of 3-bit AlGaN/GaN phase shifter.

Details

Microelectronics International, vol. 35 no. 2
Type: Research Article
ISSN: 1356-5362

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