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1 – 1 of 1Hongwei Zhang, Shihao Wang, Hongmin Mi, Shuai Lu, Le Yao and Zhiqiang Ge
The defect detection problem of color-patterned fabric is still a huge challenge due to the lack of manual defect labeling samples. Recently, many fabric defect detection…
Abstract
Purpose
The defect detection problem of color-patterned fabric is still a huge challenge due to the lack of manual defect labeling samples. Recently, many fabric defect detection algorithms based on feature engineering and deep learning have been proposed, but these methods have overdetection or miss-detection problems because they cannot adapt to the complex patterns of color-patterned fabrics. The purpose of this paper is to propose a defect detection framework based on unsupervised adversarial learning for image reconstruction to solve the above problems.
Design/methodology/approach
The proposed framework consists of three parts: a generator, a discriminator and an image postprocessing module. The generator is able to extract the features of the image and then reconstruct the image. The discriminator can supervise the generator to repair defects in the samples to improve the quality of image reconstruction. The multidifference image postprocessing module is used to obtain the final detection results of color-patterned fabric defects.
Findings
The proposed framework is compared with state-of-the-art methods on the public dataset YDFID-1(Yarn-Dyed Fabric Image Dataset-version1). The proposed framework is also validated on several classes in the MvTec AD dataset. The experimental results of various patterns/classes on YDFID-1 and MvTecAD demonstrate the effectiveness and superiority of this method in fabric defect detection.
Originality/value
It provides an automatic defect detection solution that is convenient for engineering applications for the inspection process of the color-patterned fabric manufacturing industry. A public dataset is provided for academia.
Details