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Article
Publication date: 4 January 2008

Christophe Reboud, Denis Prémel, Dominique Lesselier and Bernard Bisiaux

A numerical model dedicated to external eddy current inspection of tubes has been developed using the volume integral method (VIM). The purpose of this paper is to suggest new…

Abstract

Purpose

A numerical model dedicated to external eddy current inspection of tubes has been developed using the volume integral method (VIM). The purpose of this paper is to suggest new discretization schemes based on non‐uniform B‐splines for the solution of the state equation with the method of moments (MoM).

Design/methodology/approach

VIM is a semi‐analytical approach providing fast and accurate results for the simulation of eddy current testing (ECT) of pieces with canonical geometries. The state equation derived with this formalism is solved using the Galerkin variant of the well‐known MoM.

Findings

This paper shows that an accuracy improvement is achieved in MoM by using B‐splines with degree 1 or 2 as projection functions in MoM instead of pulse functions. Moreover, comparisons between simulation results show that, for all ECT configurations tested, the use of degree 1 B‐splines is sufficient to get this improvement.

Originality/value

The use of B‐splines functions has already been proposed for MoM in the literature, but not in the framework of the Galerkin variant of MoM. This paper also shows quantitative comparisons between experiment and simulation as well as a study of the minimal degree required to get an accuracy improvement in MoM.

Details

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, vol. 27 no. 1
Type: Research Article
ISSN: 0332-1649

Keywords

Article
Publication date: 4 January 2008

Léa Maurice, Denis Prémel, József Pávó, Dominique Lesselier and Alain Nicolas

The purpose of this paper is to describe the development of simulation tools dedicated to eddy current non destructive testing (ECNDT) on planar structures implying planar…

Abstract

Purpose

The purpose of this paper is to describe the development of simulation tools dedicated to eddy current non destructive testing (ECNDT) on planar structures implying planar defects. Two integral approaches using the Green dyadic formalism are considered.

Design/methodology/approach

The surface integral model (SIM) is dedicated to ideal cracks, whereas the volume integral method is adapted to general volumetric defects.

Findings

The authors observed that SIM provides satisfactory results, except in some critical transmitting/receiving (T/R) configurations. This led us to propose a hybrid method based on the combination of the two previous ones.

Originality/value

This method enables to simulate ECNDT on planar structures implying defects with a small opening using T/R probes.

Details

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, vol. 27 no. 1
Type: Research Article
ISSN: 0332-1649

Keywords

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