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The purpose of this paper is to propose an automatic pattern matching template generating method for the automatic optical inspection system in TFT LCD assembly and positioning process, to improve the conventional image technology. Besides, focusing on integrating the image system with the existing control system, the double aligner mark searching time is decreased to reduce the working time of the integrated system.

The improved pattern matching method of genetic algorithm was adopted, including setting for template image selecting, encoding, calculating fitness function, pattern matching, template generating and genetic algorithm steps. The predetermined pixels were selected from the target template based on the minimum difference to the block image to be tested by utilizing the genetic algorithm, and the other pixels which have not been selected were neglected.

The selected pixels were encoded for recording by sequence mode, and then the target template and the image to be tested were compared based on the calculated fitness function. This method has the advantages of using the fitness function to reduce the searching time, with the help of genetic algorithm to find the optimal target template, and saving memory space by recording target template based on the sequence mode.

The genetic algorithm used in this study is a kind of optimal tool free from gradient data. As long as the fitness function and after continuous iteration are determined, the optimal solution can be found out, and then the optimal target template can be generated.

This system uses fitness function to reduce the pattern matching time. Plural pixels are preset inside the target template, and its fitness function value is calculated. When the target template is compared with the image to be tested, only the fitness function value (also the difference of the plural pixels) is calculated and compared.

The remaining pixels are neglected, so that the searching time can be reduced greatly. The sequence mode is used to save the required memory space for recording target template. Since sequence mode is adopted to record the information of selected pixels, lots of required memory space for recording target template information will be saved.

The purpose of this paper is to apply an on‐line automatic inspection and measurement of surface defect of thin‐film transistor liquid‐crystal display (TFT‐LCD) panels in the polyimide coating process with a modified template matching method and back propagation neural network classification method.

By using the technique of searching, analyzing, and recognizing image processing methods, the target pattern image of TFT‐LCD cell defects can be obtained.

With template match and neural network classification in the database of the system, the program judges the kinds of the target defects characteristics, finds out the central position of cell defect, and analyzes cell defects.

The recognition speed becomes faster and the system becomes more flexible in comparison to the previous system. The proposed method and strategy, using unsophisticated and economical equipment, is also verified. The proposed method provides highly accurate results with a low‐error rate.

In terms of sample training, the principles of artificial neural network were used to train the sample detection rate. In sample analysis, character weight was implemented to filter the noise so as to enhance discrimination and reduce detection.

The paper describes how pre‐inspection image processing was utilized in collaboration with the system to excel the inspection efficiency of present machines as well as for reducing system misjudgment. In addition, the measure for improving cell defect inspection can be applied to production line with multi‐defects to inspect and improve six defects simultaneously, which improves the system stability greatly.

This study aimed to developed a defect detection system for a segment-type display module panel.

The system included a data acquisition card, a video camera, a computer and a display module on a testing table. The video camera captured the display pattern of the display module and transferred it to the computer through the data acquisition card. The dynamic multi-thresholding method and analysis as well as back propagation neural network classification was used to classify the detected defects.

The threshold values for the brightness at different positions in the display module image were obtained using the neural network and then stored in the look-up table, using two to six matrixes.

The recognition speed was faster and the system was more flexible in comparison to the previous system. The proposed method, using unsophisticated and economical equipment, was also verified as providing highly accurate results with a low error rate.

Man has been seeking an ideal existence for a very long time. In this existence, justice, love, and peace are no longer words, but actual experiences. How ever, with the American preemptive invasion and occupation of Afghanistan and Iraq and the subsequent prisoner abuse, such an existence seems to be farther and farther away from reality. The purpose of this work is to stop this dangerous trend by promoting justice, love, and peace through a change of the paradigm that is inconsistent with justice, love, and peace. The strong paradigm that created the strong nation like the U.S. and the strong man like George W. Bush have been the culprit, rather than the contributor, of the above three universal ideals. Thus, rather than justice, love, and peace, the strong paradigm resulted in in justice, hatred, and violence. In order to remove these three and related evils, what the world needs in the beginning of the third millenium is the weak paradigm. Through the acceptance of the latter paradigm, the golden mean or middle paradigm can be formulated, which is a synergy of the weak and the strong paradigm. In order to understand properly the meaning of these paradigms, however, some digression appears necessary.