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Article
Publication date: 19 October 2023

Teck Lee Yap, Rajkishore Nayak, Nhung T.H. Vu, Duy Tung Bui, Thi Thu Tra Pham and Darcy W.E. Allen

Blockchain-based traceability technology (BTT) is an emerging digital technology that claims to have the potential to fulfil the demand for traceability to safeguard fruit safety…

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Abstract

Purpose

Blockchain-based traceability technology (BTT) is an emerging digital technology that claims to have the potential to fulfil the demand for traceability to safeguard fruit safety. Drawing on the technological, organisational and environmental (TOE) framework, this study aims to investigate the perceived facilitators and barriers that influence the behavioural intentions of multiple stakeholders in the Vietnamese fruit supply chain (i.e., farmers, trading enterprises and consumers) to adopt BTT.

Design/methodology/approach

This study utilised a qualitative approach of semi-structured in-depth interviews with 60 stakeholders in the Vietnamese fruit supply chain to achieve the research objectives. NVivo 12 was employed to analyse the collected data using content and thematic analysis.

Findings

The findings identify several perceived facilitators that motivate BTT adoption. These include trust, transparency, business performance, the formation of alliances, consumer awareness of food safety and ethical agricultural practices, fruit branding and the pivotal role of farmers' cooperatives. Meanwhile, the perceived barriers to BTT adoption include a lack of digital literacy amongst the stakeholders, poor organisational culture, the high cost of traceability-enabled products and data privacy and security governance.

Practical implications

This study suggests that technology awareness and perceived facilitators and barriers should be incorporated into the design and deployment of blockchain-based traceability technology in the agri-food supply chain in developing countries.

Originality/value

To the best of the authors' knowledge, this study is the first qualitative paper that attempts to fill the research gap of understanding the perceived facilitators and barriers that influence the intentions of multiple stakeholders in the fruit supply chain to adopt BTT in the context of a developing economy.

Details

Information Technology & People, vol. 38 no. 1
Type: Research Article
ISSN: 0959-3845

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Article
Publication date: 31 May 2024

Muhammad Hakeem Mohammad Nazri, Tan Chou Yong, Farazila B. Yusof, Gregory Soon How Thien, Chan Kah Yoong and Yap Boon Kar

Die edge quality with its corresponding die strength are two important factors for excellent dicing quality especially for low-k wafers due to their weak mechanical properties and…

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Abstract

Purpose

Die edge quality with its corresponding die strength are two important factors for excellent dicing quality especially for low-k wafers due to their weak mechanical properties and fragile structures. It is shown in past literatures that laser dicing or grooving does yield good dicing quality with the elimination of die mechanical properties. This is due to the excess heat energy that the die absorbs throughout the procedure. Within the internal structure, the mechanical properties of low-k wafers can be further enhanced by modification of the material. The purpose of this paper is to strengthen the mechanical properties of wafers through the heat-treatment process.

Design/methodology/approach

The methodology of this approach is by heat treating several low-k wafers that are scribed with different laser energy densities with different laser micromachining parameters, i.e. laser power, frequency, feed speed, defocus reading and single/multibeam setup. An Nd:YAG ultraviolet laser diode that is operating at 355 nm wavelength was used in this study. The die responses from each wafer are thoroughly visually inspected to identify any topside chipping and peeling. The laser grooving profile shape and deepest depth are analysed using a laser profiler, while the sidewalls are characterized by scanning electron microscopy (SEM) to detect cracks and voids. The mechanical strength of each wafer types then undergoes three-point bending test, and the performance data is analyzed using Weibull plot.

Findings

The result from the experiment shows that the standard wafers are most susceptible to physical defects as compared to the heat-treated wafers. There is improvement for heat-treated wafers in terms of die structural integrity and die strength performance, which revealed a 6% increase in single beam data group for wafers that is processed using high energy density laser output but remains the same for other laser grooving settings. Whereas for multibeam data group, all heat-treated wafer with different laser settings receives a slight increase at 4% in die strength.

Originality/value

Heat-treatment process can yield improved mechanical properties for laser grooved low-k wafers and thus provide better product reliability.

Details

Microelectronics International, vol. 41 no. 4
Type: Research Article
ISSN: 1356-5362

Keywords

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