Cognex adds new training and inspection tools to VisionPro

Citation

(2004), "Cognex adds new training and inspection tools to VisionPro", Sensor Review, Vol. 24 No. 1. https://doi.org/10.1108/sr.2004.08724aad.005

Cognex adds new training and inspection tools to VisionPro

Cognex adds new training and inspection tools to VisionPro

Keywords: Machine vision, Cognex

Cognex, the world's leading supplier of machine vision systems, has expanded the capabilities of its VisionPro PC-based machine vision systems with the addition of new high-performance vision software tools. The new tools reduce set-up time, improve process yield, and provide new options for pattern training in a broad range of semiconductor and other manufacturing applications that require general-purpose machine vision for inspection, measurement, identification, and guidance. In addition to a full array of machine vision software, the popular VisionPro suite now includes the following:

Synthetic PatMax

With the addition of Synthetic PatMax, Cognex provides new options for training PatMax, the premier object location software. When an acquired image is unavailable or unsuitable for training, Synthetic PatMax can be used to generate reference models without relying on image data. With Synthetic PatMax users can import CAD (DXF) data, extract edges, or sketch freehand to create reference models. Replacing acquired image data with a synthetic definition retains essential pattern features necessary for the inspection, while excluding component details that are likely to vary. In stepper alignment applications, for example, Synthetic PatMax provides accurate origin definition using synthetic fiducial creation for ideal reference marks.

PatInspect

PatInspect is a robust, fast, and highly accurate defect detection tool (see Plate 5). Using PatMax to locate objects with high precision under a wide range of conditions, PatInspect then detects differences in the object compared to a trained image. By ignoring acceptable variations in appearance, PatInspect avoids false rejects due to part rotation, scale changes, lighting variations, and other factors. In wafer defect inspection applications, for example, PatInspect identifies micro defects such as node-level and particle defects on SEM images, as well as macro defects on visible light images such as incomplete CMP and other process imperfections.

Plate 5 PatInspect from Cognex

VisionPro eliminates the trade-off between ease of use and flexibility by combining graphical development for fast prototyping with advanced lower-level programming. The result has been widely accepted by a broad range of users to solve complex vision tasks more efficiently. These new software additions expand upon VisionPro's geometric pattern matching, OCV, ID, geometric measurement, and data analysis capabilities.

For further information, please contact: Leigh Simpson, Cognex UK Ltd, Sunningdale House, 43 Caldecotte Lake Drive, Caldecotte, Milton Keynes, Buckinghamshire, MK7 8LF. Tel: +44 (0)1908 206033; Fax: +44 (0)1908 392463; E-mail: lsimpson@cognex.com