Keywords
Citation
(2002), "NDC infrared engineering introduces a revolutionary approach to on-line measurement of ultra thin film products", Sensor Review, Vol. 22 No. 2. https://doi.org/10.1108/sr.2002.08722baf.006
Publisher
:Emerald Group Publishing Limited
Copyright © 2002, MCB UP Limited
NDC infrared engineering introduces a revolutionary approach to on-line measurement of ultra thin film products
Keywords: Film imaging, Infrared
NDC Infrared Engineering has developed a new on-line thickness gauge called TFG-710. The new sensor offers a revolutionary approach to ultra thin film products using proprietary near infrared (NIR) technology. The result is high performance thickness measurement down to five microns or less, providing a new level of on-line measurement accuracy and precision.
Designed specifically for cast and biaxially oriented films, TFG-710 provides real-time measurement with a single scan. NDC Infrared Engineering has overcome the effects of optical fringe interference (a phenomenon that will occur with other NIR gauges attempting to measure the thickness of thin plastic films) by developing a patented near infrared design. TFG-710 also renders greater accuracy and resolution than typical beta sensors, producing high-resolution measurement edge to edge, without the inherent statistical noise of beta gauges.
TFG-710 is unaffected by changes in humidity, air pressure, gap temperature, dust, film orientation or crystallinity. The gauge is also insensitive to changes in pass-line, barometric pressure, haze, flutter, scanner mechanical run-out or orientation. TFG-710 is simple to calibrate, requiring no special tools or skills. Since the sensor is non-nuclear, special licensing, handling, and testing procedures are not required. TFG-7 10 is easy to operate and simple to maintain. A five-year warranty is included on all mechanical parts.