Keywords
Citation
(1999), "Vantage produces 3D scans of thick film", Microelectronics International, Vol. 16 No. 1. https://doi.org/10.1108/mi.1999.21816aad.006
Publisher
:Emerald Group Publishing Limited
Copyright © 1999, MCB UP Limited
Vantage produces 3D scans of thick film
Vantage™ produces 3D scans of thick film
Keywords CyberOptics, Inspection, Thick film
CyberOptics introduces Vantage, the latest addition to the company's line of CyberScan® inspection systems (Plate 3). Vantage is well-suited to thick film inspection because non-contact technology makes it possible to measure film deposits at the critical wet stage, when defective circuits can be identified before firing. Final yields are improved and scrap is reduced when poorly-printed circuits are identified early in the process. The system can also be used to inspect thick film circuits at the dry and fired stages.
Plate 3CyberScan®
Vantage employs CyberOptics' newest laser sensor to achieve height resolutions as fine as 0.125 microns (0.005 mils). Three-dimensional scanning produces a topographical map of the measurement area, as well as a two-dimensional profile. A live, magnified view of the laser spot location is viewable on the monitor. Linear-encoded precision stages provide six inches of travel in x and y directions.
Vantage comes with CyberOptics' Windows® based SCAN™ software for performing measurements and raster scanning. AutoSCAN™ software for programming repetitious and multisite scanning routines using Microsoft Visual Basic® is available as an option.
For more information. Tel: +1 (800) 746-6315 or +1 (612) 542 5927.