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Validation of the positive and negative affect schedule (PANAS) among employees in Indian manufacturing and service sector organisations

Rinki Dahiya (Department of Management Studies, Indian Institute of Technology Roorkee, Roorkee, India)
Santosh Rangnekar (Department of Management Studies, Indian Institute of Technology Roorkee, Roorkee, India)

Industrial and Commercial Training

ISSN: 0019-7858

Article publication date: 13 March 2019

Issue publication date: 24 April 2019

651

Abstract

Purpose

The purpose of this paper is to examine the psychometric properties of the positive and negative affect schedule (PANAS) in a sample of employees working in Indian manufacturing and service sector organisations.

Design/methodology/approach

The data were collected through self-administered structured questionnaire from 53 employees for the pilot study and 383 employees for the final study. For the psychometric evaluation of the PANAS, item analysis, reliability, exploratory factor analysis, convergent–discriminant validity and confirmatory factor analysis were performed.

Findings

Results reveal that the two-factor model of affect (positive and negative affects) is valid in the Indian manufacturing and service sector organisations.

Originality/value

Despite being the largest skilled labour facilitator for the work economy and second largest populated country, India lags behind in studies evaluating affect at work when compared to western nations. The present study was taken up to validate an instrument to measure affect at work in Indian manufacturing and service sector organisations, which is a new contribution in the field. Validation of this instrument would help in promoting studies on affect at work in India and comparative studies across cultures.

Keywords

Citation

Dahiya, R. and Rangnekar, S. (2019), "Validation of the positive and negative affect schedule (PANAS) among employees in Indian manufacturing and service sector organisations", Industrial and Commercial Training, Vol. 51 No. 3, pp. 184-194. https://doi.org/10.1108/ICT-08-2018-0070

Publisher

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Emerald Publishing Limited

Copyright © 2019, Emerald Publishing Limited

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