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COMPARISON OF COUPLED AND DECOUPLED METHODS FOR SEMICONDUCTOR DEVICE MODELING

M.S. Obrecht, E.L. Heasell, M.I. Elmasry
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Abstract

Computational speed and robustness of the coupled (MEDICI) and decoupled (TRASIM) method based simulators are compared. Transient and steady‐state avalanche simulations are presented. The decoupled method shows significantly lower memory requirements, higher robustness and up to 30 times higher speed.

Citation

Obrecht, M.S., Heasell, E.L. and Elmasry, M.I. (1994), "COMPARISON OF COUPLED AND DECOUPLED METHODS FOR SEMICONDUCTOR DEVICE MODELING", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 13 No. 4, pp. 785-794. https://doi.org/10.1108/eb051895

Publisher

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MCB UP Ltd

Copyright © 1994, MCB UP Limited

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