COMPARISON OF COUPLED AND DECOUPLED METHODS FOR SEMICONDUCTOR DEVICE MODELING
ISSN: 0332-1649
Article publication date: 1 April 1994
Abstract
Computational speed and robustness of the coupled (MEDICI) and decoupled (TRASIM) method based simulators are compared. Transient and steady‐state avalanche simulations are presented. The decoupled method shows significantly lower memory requirements, higher robustness and up to 30 times higher speed.
Citation
Obrecht, M.S., Heasell, E.L. and Elmasry, M.I. (1994), "COMPARISON OF COUPLED AND DECOUPLED METHODS FOR SEMICONDUCTOR DEVICE MODELING", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 13 No. 4, pp. 785-794. https://doi.org/10.1108/eb051895
Publisher
:MCB UP Ltd
Copyright © 1994, MCB UP Limited