Processing and Diagnostics for Thick Film Superconductors Produced from Y‐Ba‐Cu‐O Materials
J.S. Choi
(Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
M. Bhalodia
(Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
S. Samph
(Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
P. Snowden
(Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
P. Yahner
(Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
K.J. Scoles
(Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
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Abstract
Thick film superconductors have been produced by screen printing and annealing pastes made from oxide powders and pre‐annealed powders. These films have been analysed by X‐ray diffraction, microwave absorption, resistance vs. temperature measurements, and adhesion tests. Results show the correlation between structural and electrical properties.
Citation
Choi, J.S., Bhalodia, M., Samph, S., Snowden, P., Yahner, P. and Scoles, K.J. (1989), "Processing and Diagnostics for Thick Film Superconductors Produced from Y‐Ba‐Cu‐O Materials", Microelectronics International, Vol. 6 No. 2, pp. 17-22. https://doi.org/10.1108/eb044367
Publisher
:MCB UP Ltd
Copyright © 1989, MCB UP Limited