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X‐rays give in‐depth inspection

Richard Parmee (Barrich Technology Ltd.)

Sensor Review

ISSN: 0260-2288

Article publication date: 1 February 1990

30

Abstract

The use of X‐rays for inspecting baggage and weld quality is well known, however, recent food contamination scares have put the spotlight on new and ever more demanding applications.

Citation

Parmee, R. (1990), "X‐rays give in‐depth inspection", Sensor Review, Vol. 10 No. 2, pp. 84-86. https://doi.org/10.1108/eb007818

Publisher

:

MCB UP Ltd

Copyright © 1990, MCB UP Limited

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