Field distortions highlight product defects
Shawn Buckley
(vice president R&D, Cochlea Corporation, USA)
22
Abstract
Objects can be inspected by measuring the way in which they distort acoustic, inductive, capacitive and microwave fields.
Citation
Buckley, S. (1990), "Field distortions highlight product defects", Sensor Review, Vol. 10 No. 2, pp. 75-78. https://doi.org/10.1108/eb007816
Publisher
:MCB UP Ltd
Copyright © 1990, MCB UP Limited