Keywords
Citation
(2001), "Non-contact and contact measurement Quick Vision", Aircraft Engineering and Aerospace Technology, Vol. 73 No. 4. https://doi.org/10.1108/aeat.2001.12773dad.017
Publisher
:Emerald Group Publishing Limited
Copyright © 2001, MCB UP Limited
Non-contact and contact measurement Quick Vision
Non-contact and contact measurement Quick VisionKeywords: Mitutoyo, Probes
To add more versatility to its Quick Vision non-contact CMM range, a touch trigger probe system with a probe module changing facility is now available from Mitutoyo. This will reportedly expand the measurement capabilities of Quick Vision without any impairment to the performance of the image processing system. Touch probe and optical measurements can be undertaken without any special settings for the system.
Mitutoyo informs us that the TP20 or TP200 touch probe systems can be retrofitted to existing Quick Vision CMMs or can be specified as part of a new machine. A wide range of measuring tasks can be carried out with the probe system with user-friendly operation promoted through its Windows NT4 operating system. Additional programs can be added to carry out a wider range of measurement and analysis tasks.
Further details are available from Mitutoyo (UK) Limited. Tel: +44 (0) 1264 353123; Fax 01 264 345883; E-mail: janice.cook@mitutoyo.co.uk