A model of changing of charge carriers mobility value in an implanted-junction rectifier under influence of mismatch-induced stress
Multidiscipline Modeling in Materials and Structures
ISSN: 1573-6105
Article publication date: 23 January 2023
Issue publication date: 24 February 2023
Abstract
Purpose
The purpose of this paper is (1) to analyze the dependence of charge carriers mobility in an implanted-junction heterorectifier on mismatch-induced stress and (2) to elaborate an analytical approach for analysis of mass transfer with the possibility to take into account changing of parameters of mass transport in space and time at one time as well as nonlinearity of the considered transfer.
Design/methodology/approach
In this paper, the author analyzed charge carriers mobility changing in an implanted-junction heterorectifier under the influence of mismatch-induced stress. The author introduced a model to describe the considered changing of carriers mobility. Based on the analysis of the model, the author formulated conditions (1) to decrease and to increase of the mobility under influence of the stress; and (2) the author analyzed the possibility to control of mismatch-induced stress by radiation processing of materials of the considered multilayer structure. The author also introduced an analytical approach for analysis of mass transfer. The approach gives a possibility to take into account changing of parameters of mass transport in space and time at one time as well as nonlinearity of the considered transfer.
Findings
Findings dependence of charge carriers mobility in an implanted-junction heterorectifier on mismatch-induced stress. Also the author finds an analytical approach for analysis of mass transfer. The approach gives a possibility to take into account changing of parameters of mass transport in space and time at one time as well as nonlinearity of the considered transfer.
Originality/value
All results of this paper are original.
Keywords
Citation
Pankratov, E.L. (2023), "A model of changing of charge carriers mobility value in an implanted-junction rectifier under influence of mismatch-induced stress", Multidiscipline Modeling in Materials and Structures, Vol. 19 No. 2, pp. 125-144. https://doi.org/10.1108/MMMS-06-2022-0102
Publisher
:Emerald Publishing Limited
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