User experience of digital science and education evaluation platform: identification and analysis of key influencing factors

Abstract

Purpose

Establishing and developing digital science and education evaluation platforms (DSEEPs) have several practical implications for the development of China's science, technology and education. Identifying and analyzing the key factors influencing DSEEP user experience (UX) can improve the users' willingness to use the platform and effectively promote its sustainable development.

Design/methodology/approach

First, a literature survey, a five-element model of UX and semi-structured interviews were used in this study to develop a DSEEP UX-influencing factor model, which included five dimensions and 22 influencing factors. Second, the model validity was verified using questionnaire data. Finally, the key influencing factors were identified and analyzed using a fuzzy decision-making trial and evaluation laboratory (fuzzy-DEMATEL) method.

Findings

Fourteen influencing factors, including diverse information forms and comprehensive information content, are crucial for the DSEEP UX. Its optimization path is “‘Function Services’ → ‘Information Resources’ → ‘Interaction Design’ → ‘Interface Design’ and ‘Visual Design’.” In this regard, platform managers can take the following measures to optimize UX: strengthening functional services, improving information resources, enhancing the interactive experience and considering interface effects.

Originality/value

This study uses a combination of qualitative and quantitative research methods to determine the key influencing factors and optimization path of DSEEP UX. Optimization suggestions for UX are proposed from the perspective of platform managers, who provide an effective theoretical reference for innovating and developing a DSEEP.

Citation

Qiu, J., Xu, Z., Luo, H., Zhou, J. and Zhang, Y. (2024), "User experience of digital science and education evaluation platform: identification and analysis of key influencing factors", Library Hi Tech, Vol. 42 No. 6, pp. 1839-1862. https://doi.org/10.1108/LHT-10-2022-0468