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Experimental study on micro-drills wear during high speed of drilling IC substrate

Linfang Wang (Guangdong University of Technology, Guangzhou, China)
Lijuan Zheng (Guangdong University of Technology, Guangzhou, China)
Cheng yong Wang (Guangdong University of Technology, Guangzhou, China)
Shan Li (Guangdong University of Technology, Guangzhou, China)
Yuexian Song (Guangdong University of Technology, Guangzhou, China)
Lunqiang Zhang (Shenzhen Liu Xin Industrial Co. Ltd, Shenzhen, China)
Peng Sun (Guangdong Sheng Yi SCI Tech Co. Ltd, Dong guan, China)

Circuit World

ISSN: 0305-6120

Article publication date: 29 April 2014

513

Abstract

Purpose

Compared with the traditional printed circuit board (PCB) drilling process, the technology of drilling IC substrate is facing more problems, such as much smaller hole diameter, more intensive hole space, thinner sheet and more complicated materials are drilled in process. Moreover, the base material of IC substrate is different from traditional PCB, more kinds of fillers added in IC substrate which make the drill worn seriously during drilling process. Micro-drills wear and micro holes quality are the most important questions when drilling IC substrate so far. Wear morphology of micro-drill, holes wall roughness and hole location accuracy are researched in this paper. The influence factors of micro-drills wear and micro holes quality are also studied in this drilling process. The paper aims to discuss these issues.

Design/methodology/approach

Two drills with same structure and different diameter are used to drill different stacks of IC substrate and drill different holes in this paper. There are four experiments made and the drilling parameters including spindle speed (n), feed rate (vf) and retraction speed (vr) are recommended by drill manufacturing company. Wear morphologies of drill are observed, holes wall roughness (Rmax) and holes location accuracy (Cpk) are measured in this paper. Analyzing the main factors influence on drill wear, holes wall roughness and holes location accuracy through these experiments.

Findings

The micro-drills of IC substrate wear more severely compared with other material of PCB through the experimental results in this paper. Drill diameter has influence on micro-drill wear when drilling IC substrate, the smaller of drill is, the more severely of micro-drill wears. Drill diameter affect the holes wall roughness too, the holes wall roughness of larger holes is better than smaller one in a certain range. The drilled holes number also has influence on micro-drills wear, holes wall roughness and holes location accuracy. The more drilled holes, the seriously of micro-drills wear, and the worn drill would destroy the hole quality. Therefore, the more drilled holes lead the bad holes wall roughness and holes location accuracy in this paper. In addition, stacks of IC substrate affect much on the holes location accuracy, the more stacks, the worse holes location accuracy.

Originality/value

Chinese Mainland is obviously lagging behind in technology and manufacturer of IC substrate which is incompatible with the nation circumstances. There is few research of drilling IC substrate in China and research data are lacking so far. It is most necessary to improve the technology level of drilling IC substrate in China. In order to reduce the wear of micro-drills and improve the quality of micro-holes, many experimental tests about drilling IC substrate are researched in this paper.

Keywords

Acknowledgements

This research was funded by the Program of China Postdoctoral Science Foundation (Grant No. 2012M521574) and the Key Program of NSFC-Guangdong Joint Fund, China (Grant No. U0734007) and the Special Foundation of China Postdoctoral Science (Grant No. 2013T60789).

Citation

Wang, L., Zheng, L., yong Wang, C., Li, S., Song, Y., Zhang, L. and Sun, P. (2014), "Experimental study on micro-drills wear during high speed of drilling IC substrate", Circuit World, Vol. 40 No. 2, pp. 61-70. https://doi.org/10.1108/CW-11-2013-0048

Publisher

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Emerald Group Publishing Limited

Copyright © 2014, Emerald Group Publishing Limited

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