Experimental technique for high-frequency conductivity measurement
ISSN: 0332-1649
Article publication date: 23 August 2019
Issue publication date: 21 October 2019
Abstract
Purpose
The purpose of this study is to introduce a novel method for the measurement of electromagnetic material parameters.
Design/methodology/approach
The main idea behind the approach is the fact that for slabs with elongated shapes, the intensity of the backscattered field and the electromagnetic resonance frequency corresponding to the length of the sample are dependent on the conductivity of the sample’s material.
Findings
It is shown that for a known scattered field and resonance frequency, it is possible to formulate an inverse problem as to the calculation of the conductivity of the sample’s material at the considered frequencies. To investigate the applicability of the method, demonstrative experiments are performed during which the micro-Doppler effect is used to increase the measurement accuracy. The idea is extended to the case of anisotropic samples, with slight modifications proposed to the experimental setup in the case of significant anisotropy in the investigated material.
Practical implications
The measurement method may prove useful for the investigation of the high-frequency conductive properties of certain materials of interest.
Originality/value
To the best of the authors’ knowledge, this is the first time the use of the micro-Doppler effect is proposed for the purpose of the measurement of material parameters.
Keywords
Acknowledgements
The authors are grateful to Tamás Pető for his contribution in the experiments. This work is supported by the Jànos Bolyai Research Scholarship and by the ÚNKP-18-4 New National Excellence Program of the Ministry of Human Capacities, Hungary; further support was provided by the BME Artificial Intelligence FIKP grant of EMMI (BME FIKP-MI/SC).
Citation
Marák, K., Bilicz, S. and Pávó, J. (2019), "Experimental technique for high-frequency conductivity measurement", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 38 No. 5, pp. 1711-1722. https://doi.org/10.1108/COMPEL-12-2018-0502
Publisher
:Emerald Publishing Limited
Copyright © 2019, Emerald Publishing Limited