Stable compact modeling of piezoelectric energy harvester devices

Abstract

Purpose

Based on the framework of Krylov subspace-based model order reduction (MOR), compact models of the piezoelectric energy harvester devices can be generated. However, the stability of reduced piezoelectric model often cannot be preserved. In previous research studies, “MOR after Schur,” “Schur after MOR” and “multiphysics structure preserving MOR” methods have proven successful in obtaining stable reduced piezoelectric energy harvester models. Though the stability preservation of “MOR after Schur” and “Schur after MOR” methods has already been mathematically proven, the “multiphysics structure preserving MOR” method was not. This paper aims to provide the missing mathematical proof of “multiphysics structure preserving MOR.”

Design/methodology/approach

Piezoelectric energy harvesters can be represented by system of differential-algebraic equations obtained by the finite element method. According to the block structure of its system matrices, “MOR after Schur” and “Schur after MOR” both perform Schur complement transformations either before or after the MOR process. For the “multiphysics structure preserving MOR” method, the original block structure of the system matrices is preserved during MOR. 

Findings

This contribution shows that, in comparison to “MOR after Schur” and “Schur after MOR” methods, “multiphysics structure preserving MOR” method performs the Schur complement transformation implicitly, and therefore, stabilizes the reduced piezoelectric model.

Originality/value

The stability preservation of the reduced piezoelectric energy harvester model obtained through “multiphysics structure preserving MOR” method is proven mathematically and further validated by numerical experiments on two different piezoelectric energy harvester devices.

Citation

Yuan, C., Hu, S. and Bechtold, T. (2020), "Stable compact modeling of piezoelectric energy harvester devices", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 39 No. 2, pp. 467-480. https://doi.org/10.1108/COMPEL-07-2019-0305