Identification of Duhem-type piezoelectric hysteresis using a modified bee colony algorithm

Abstract

Purpose

The determination of parameters of Duhem model that can describe piezoelectric hysteresis is usually a great challenge. The purpose of this paper is to find a way to identify the parameters of Duhem model by using a modified bee colony algorithm.

Design/methodology/approach

The promising bee colony algorithm has great potential to identify hysteresis nonlinearity, but has not yet been used to identify the Duhem-type hysteresis in the literatures. To explore this possibility, the classical bee colony algorithm is modified to enhance its performance regarding both searching capability and convergence speed. In the modification, the current optimal solution is used to guide the search direction, which can balance the local and global searching ability. Moreover, a new searching formula for scout bees is proposed to enhance the convergence ability of the algorithm.

Findings

Through a series of experiments, the modified algorithm can attain the optimal parameters with a 0.61 µm peak valley error and a 0.12 µm root-mean-square error. Compared to the particle swarm optimization and classical bee colony algorithms, the modified bee colony algorithm can reach higher parameter identification accuracy. Based on 50 trials, the robustness of the posed algorithm was also proved.

Originality/value

The well-performed modified bee colony algorithm is a good candidate in parameter identification of Duhem-type hysteresis nonlinear systems. As there is no work studying the parameter identification of Duhem model using a bee colony algorithm in the literatures, this work closed this gap and explored the ability of bee colony algorithm to identify piezoelectric hysteresis with superb accuracy and robustness.

Citation

Chen, Q. and Yang, Z.-X. (2020), "Identification of Duhem-type piezoelectric hysteresis using a modified bee colony algorithm", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 39 No. 2, pp. 249-264. https://doi.org/10.1108/COMPEL-05-2019-0194