Defect localization and characterization in eddy current nondestructive testing by change detection and global optimization
ISSN: 0332-1649
Article publication date: 5 March 2018
Abstract
Purpose
This paper aims to present a data-processing methodology combining kernel change detection (KCD) and efficient global optimization algorithms for solving inverse problem in eddy current non-destructive testing. The main purpose is to reduce the computation cost of eddy current data inversion, which is essentially because of the heavy forward modelling with finite element method and the non-linearity of the parameter estimation problem.
Design/methodology/approach
The KCD algorithm is adapted and applied to detect damaged parts in an inspected conductive tube using probe impedance signal. The localization step allows in reducing the number of measurement data that will be processed for estimating the flaw characteristics using a global optimization algorithm (efficient global optimization). Actually, the minimized objective function is calculated from data related to defect detection indexes provided by KCD.
Findings
Simulation results show the efficiency of the proposed methodology in terms of defect detection and localization; a significant reduction of computing time is obtained in the step of defect characterization.
Originality/value
This study is the first of its kind that combines a change detection method (KCD) with a global optimization algorithm (efficient global optimization) for defect detection and characterization. To show that such approach allows to reduce the numerical cost of ECT data inversion.
Keywords
Citation
Kermadi, M., Moussaoui, S., Taieb Brahimi, A. and Feliachi, M. (2018), "Defect localization and characterization in eddy current nondestructive testing by change detection and global optimization", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 37 No. 2, pp. 948-970. https://doi.org/10.1108/COMPEL-05-2017-0201
Publisher
:Emerald Publishing Limited
Copyright © 2018, Emerald Publishing Limited