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Galvanic corrosion of electronic material copper coupled silver-coating in electronic systems

Hualiang Huang (School of Chemistry and Environmental Engineering, Key Laboratory of Green Chemical Process of Ministry of Education, Key Laboratory of Novel Reactor and Green Chemical Technology of Hubei Province, Wuhan Institute of Technology, Wuhan, PR China)
Furong Bu (School of Chemistry and Environmental Engineering, Key Laboratory of Green Chemical Process of Ministry of Education, Key Laboratory of Novel Reactor and Green Chemical Technology of Hubei Province, Wuhan Institute of Technology, Wuhan, PR China)

Anti-Corrosion Methods and Materials

ISSN: 0003-5599

Article publication date: 19 August 2019

Issue publication date: 17 October 2019

282

Abstract

Purpose

The purpose of this study is to provide a theoretical basis for the study of the galvanic corrosion mechanism of copper coupled silver-coating under a thin electrolyte layer in electronic systems.

Design/methodology/approach

Electrochemical measurements and surface characterizations.

Findings

The results indicate that the potential difference between copper and silver electrodes first quickly increases, and then reaches a relatively stable and large value with the extension of the immersion time. With the significant increase in the cathode/anode area ratio in electronic systems, the area ratio effect obviously accelerates the corrosion of copper due to the remarkable promotion of the cathode process. For a large cathode/anode area ratio, the galvanic current density always maintains a large value and exhibits an increasing trend with the extension of the immersion time, which is attributed that the area ratio effect reduces the protection of corrosion products. For the same area of cathode and anode, the galvanic current density always maintains a small value with the extension of the immersion time due to a low galvanic effect and protective corrosion products.

Practical implications

This work provides some information for the establishment of reliably protective measures for electronic systems in service.

Social implications

This work not only provides some information for the establishment of reliably protective measures for electronic systems in service, but also provides a theoretical basis for the selection of metal materials in microelectronic systems.

Originality/value

This work provides not only a theoretical basis for the study of the galvanic corrosion mechanism of Cu/Ag under a thin electrolyte layer, but also provides some information for the establishment of reliably protective measures for electronic systems in service.

Keywords

Acknowledgements

The authors thank the financial support of the National Natural Science Foundation of China (No. 51401151) and the National Natural Science Foundation of Hubei (No. 2018CFB525).

Citation

Huang, H. and Bu, F. (2019), "Galvanic corrosion of electronic material copper coupled silver-coating in electronic systems", Anti-Corrosion Methods and Materials, Vol. 66 No. 6, pp. 730-745. https://doi.org/10.1108/ACMM-01-2019-2056

Publisher

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Emerald Publishing Limited

Copyright © 2019, Emerald Publishing Limited

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