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Full wave numerical modelling of terahertz systems for nondestructive evaluation of dielectric structures

Przemyslaw Lopato (Department of Electrical and Computer Engineering, West Pomeranian University of Technology, Szczecin, Szczecin, Poland)
Tomasz Chady (Department of Electrical and Computer Engineering, West Pomeranian University of Technology, Szczecin, Szczecin, Poland)
Ryszard Sikora (Department of Electrical and Computer Engineering, West Pomeranian University of Technology, Szczecin, Szczecin, Poland)
Stanislaw Gratkowski (Department of Electrical and Computer Engineering, West Pomeranian University of Technology, Szczecin, Szczecin, Poland)
Marcin Ziolkowski (Department of Electrical and Computer Engineering, West Pomeranian University of Technology, Szczecin, Szczecin, Poland)

Abstract

Purpose

The purpose of this paper is to describe the full‐wave modelling of pulsed terahertz systems utilized in non‐destructive testing.

Design/methodology/approach

At the outset, some basic information on the terahertz NDT are outlined and then, general remarks on its numerical modelling are presented. Frequency domain FEM and time domain FDTD analysis is carried out. Finally comparison of computed and measured signals is shown in order to prove numerical analysis correctness.

Findings

It is possible to model in a relatively simple way a terahertz system for nondestructive evaluation of dielectric materials. In contrast to other published work, the entire measuring setup is modelled, including photoconductive antenna with hemispherical lens, focusing lens and evaluated material with exemplary defect.

Originality/value

This paper gives a description of the terahertz non‐destructive testing system with comparison of simulated and measured results.

Keywords

Citation

Lopato, P., Chady, T., Sikora, R., Gratkowski, S. and Ziolkowski, M. (2013), "Full wave numerical modelling of terahertz systems for nondestructive evaluation of dielectric structures", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 32 No. 3, pp. 736-749. https://doi.org/10.1108/03321641311305719

Publisher

:

Emerald Group Publishing Limited

Copyright © 2013, Emerald Group Publishing Limited

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