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Object shape virtualization in impedance tomography

Tomasz Grzywacz (Electrotechnical Institute, Warsaw, Poland Warsaw University of Technology, Warsaw, Poland)
Jan Sikora (Electrotechnical Institute, Warsaw, Poland)
Stefan Wójtowicz (Warsaw University of Technology, Warsaw, Poland)
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Abstract

Purpose

The purpose of this paper is to introduce a method for increasing imaging quality in impedance tomography. The paper presents an optical method of shape virtualization, processing algorithm draft and results of virtualization for sample objects.

Design/methodology/approach

In impedance tomography the image reconstruction algorithms must yield accurate images of impedance changes. One of the keys to producing an accurate reconstructed image is the inclusion of prior information regarding the physical geometry of the object. When the object under investigation is filled with transparent medium, optical methods can provide information about its interior and estimate the shape of non‐transparent interjections. Computer graphics methods (e.g. ray tracing) can be used to simulate propagation of the light transmitted along straight lines within the object, and thus yield geometric data to better imaging. The process of setting up boundary conditions is then supplied with additional information about interior of the object, which can significantly improve solution of the forward problem in impedance tomography.

Findings

The visibility matrix includes information about the interior of the object. However, the information is incomplete since the scanning is done along one axis. In order to obtain all remaining data, scanning along three axes is required. On the basis of the visibility matrix, the shape and volume of the non‐transparent interjections are recovered and then estimated.

Originality/value

The biggest novelty is indeed the combination of methods used in optical tomography with those in impedance tomography.

Keywords

Citation

Grzywacz, T., Sikora, J. and Wójtowicz, S. (2009), "Object shape virtualization in impedance tomography", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 28 No. 1, pp. 221-230. https://doi.org/10.1108/03321640910919011

Publisher

:

Emerald Group Publishing Limited

Copyright © 2009, Emerald Group Publishing Limited

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