The exponentiated Weibull software reliability growth model with various testing‐efforts and optimal release policy: A performance analysis
International Journal of Quality & Reliability Management
ISSN: 0265-671X
Article publication date: 25 January 2008
Abstract
Purpose
The purpose of this research is to incorporate the exponentiated Weibull testing‐effort functions into software reliability modeling and to estimate the optimal software release time.
Design/methodology/approach
This paper suggests a software reliability growth model based on the non‐homogeneous Poisson process (NHPP) which incorporates the exponentiated Weibull (EW) testing‐efforts.
Findings
Experimental results on actual data from three software projects are compared with other existing models which reveal that the proposed software reliability growth model with EW testing‐effort is wider and effective SRGM.
Research limitations/implications
This paper presents a SRGM using a constant error detection rate per unit testing‐effort.
Practical implications
Software reliability growth model is one of the fundamental techniques to assess software reliability quantitatively. The results obtained in this paper will be useful during the software testing process.
Originality/value
The present scheme has a flexible structure and may cover many of the earlier results on software reliability growth modeling. In general, this paper also provides a framework in which many software reliability growth models can be described.
Keywords
Citation
Ahmad, N., Bokhari, M.U., Quadri, S.M.K. and Khan, M.G.M. (2008), "The exponentiated Weibull software reliability growth model with various testing‐efforts and optimal release policy: A performance analysis", International Journal of Quality & Reliability Management, Vol. 25 No. 2, pp. 211-235. https://doi.org/10.1108/02656710810846952
Publisher
:Emerald Group Publishing Limited
Copyright © 2008, Emerald Group Publishing Limited