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Machine vision inspection system for film

Wang Jin‐Jiang (College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China)
Wang Zheng (College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China)
Mo Xu‐Tao (College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China)
Wang Peng (Department of Applied Mathematics, North University of China, Taiyuan, People's Republic of China)
Liu Ming (College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China)
Ren Li (College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China)
Zhu Yue (College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China)
Zhang Fang (College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China)
Liu Wen‐Yao (College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China)

Sensor Review

ISSN: 0260-2288

Article publication date: 3 July 2007

274

Abstract

Purpose

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Film is an important recording medium in industry. How to ensure film quality is a problem, because the film is produced in a dark room. Aims to focus on this.

Design/methodology/approach

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An inspection system based on machine vision is presented which could assure illumination and imaging at 940 nm which is safe for film.

Findings

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An objective evaluation is given using an image processing method and satisfactory results are obtained. Now, the inspection system is used by the biggest film company in China.

Originality/value

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This work focuses on an important issue in film production.

Keywords

Citation

Jin‐Jiang, W., Zheng, W., Xu‐Tao, M., Peng, W., Ming, L., Li, R., Yue, Z., Fang, Z. and Wen‐Yao, L. (2007), "Machine vision inspection system for film", Sensor Review, Vol. 27 No. 3, pp. 212-216. https://doi.org/10.1108/02602280710758156

Publisher

:

Emerald Group Publishing Limited

Copyright © 2007, Emerald Group Publishing Limited

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